Stéphane Kirmser

	2009
2		Carsten Wegener, Heinz Mattes, Stéphane Kirmser, Frank Demmerle, Sebastian Sattler: Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores. J. Electronic Testing 25(6): 301-308 (2009)
	2006
1		Heinz Mattes, Stéphane Kirmser, Sebastian Sattler: Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation. J. Electronic Testing 22(4-6): 337-350 (2006)

Coauthor Index

1	Frank Demmerle	[2]
2	Heinz Mattes	[1] [2]
3	Sebastian Sattler	[1] [2]
4	Carsten Wegener	[2]

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