E. Kinsbron

	1991
1		E. Weis, E. Kinsbron, M. Snyder, B. Vogel, N. Croitoru: Electromigration Effects in VLSI Due to Various Current Types. ITC 1991: 354-357

Coauthor Index

1	N. Croitoru	[1]
2	M. Snyder	[1]
3	B. Vogel	[1]
4	E. Weis	[1]

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