Von-Kyoung Kim

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1999

5 Von-Kyoung Kim, Tom Chen, Mick Tegethoff: Fault Coverage Estimation for Early Stage of VLSI Design. Great Lakes Symposium on VLSI 1999: 105-108

4 Von-Kyoung Kim, Tom Chen: Assessing Defect Coverage of Memory Testing Algorithms. Great Lakes Symposium on VLSI 1999: 340-

3 Von-Kyoung Kim, Tom Chen: On comparing functional fault coverage and defect coverage for memory testing. IEEE Trans. on CAD of Integrated Circuits and Systems 18(11): 1676-1683 (1999)

1997

2 Von-Kyoung Kim, Tom Chen, Mick Tegethoff: ASIC Manufacturing Test Cost Prediction at Early Design Stage. ITC 1997: 356-361

1996

1 Von-Kyoung Kim, Mick Tegethoff, Tom Chen: ASIC Yield Estimation at Early Design Cycle. ITC 1996: 590-594

	1999
5		Von-Kyoung Kim, Tom Chen, Mick Tegethoff: Fault Coverage Estimation for Early Stage of VLSI Design. Great Lakes Symposium on VLSI 1999: 105-108
4		Von-Kyoung Kim, Tom Chen: Assessing Defect Coverage of Memory Testing Algorithms. Great Lakes Symposium on VLSI 1999: 340-
3		Von-Kyoung Kim, Tom Chen: On comparing functional fault coverage and defect coverage for memory testing. IEEE Trans. on CAD of Integrated Circuits and Systems 18(11): 1676-1683 (1999)
	1997
2		Von-Kyoung Kim, Tom Chen, Mick Tegethoff: ASIC Manufacturing Test Cost Prediction at Early Design Stage. ITC 1997: 356-361
	1996
1		Von-Kyoung Kim, Mick Tegethoff, Tom Chen: ASIC Yield Estimation at Early Design Cycle. ITC 1996: 590-594

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