 | 2010 |
|---|
| 8 |       | Yeoul Na,
Seokjoong Hwang,
Giseong Bak,
Seon Wook Kim,
Cheol Ho Lee,
Junkyu Min,
Taejin Kim:
Hierarchical data structure-based timing controller design for plasma display panels.
ISCAS 2010: 4121-4124 |
| 2009 |
|---|
| 7 | | Sunghoon Chun,
YongJoon Kim,
Taejin Kim,
Sungho Kang:
A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections.
VTS 2009: 152-157 |
| 6 | | Sunghoon Chun,
Taejin Kim,
Sungho Kang:
ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(9): 1401-1413 (2009) |
| 5 | | Inhwa Jung,
Daejung Shin,
Taejin Kim,
Chulwoo Kim:
A 140-Mb/s to 1.82-Gb/s Continuous-Rate Embedded Clock Receiver for Flat-Panel Displays.
IEEE Trans. on Circuits and Systems 56-II(10): 773-777 (2009) |
| 2008 |
|---|
| 4 | | Sunghoon Chun,
Taejin Kim,
Sungho Kang:
A new low energy BIST using a statistical code.
ASP-DAC 2008: 647-652 |
| 3 | | Sunghoon Chun,
Taejin Kim,
YongJoon Kim,
Sungho Kang:
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.
VTS 2008: 73-78 |
| 2 | | DongSup Song,
Jin-Ho Ahn,
Taejin Kim,
Sungho Kang:
MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs.
IEICE Transactions 91-D(4): 1197-1200 (2008) |
| 2004 |
|---|
| 1 | | Changwoo Pyo,
Byungchul Bae,
Taejin Kim,
Gyungho Lee:
Run-time Detection of Buffer Overflow Attacks without Explicit Sensor Data Objects.
ITCC (1) 2004: 50- |
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