 | 2010 |
| 3 |  | Thanh D. B. Nguyen,
Young-Il Lim,
Won-Hyeon Eom,
Seong-Joon Kim,
Kyung-Seun Yoo:
Experiment and CFD simulation of hybrid SNCR-SCR using urea solution in a pilot-scale reactor.
Computers & Chemical Engineering 34(10): 1580-1589 (2010) |
| 2008 |
| 2 |  | Suk Joo Bae,
Seong-Joon Kim,
Man Soo Kim,
Bae Jin Lee,
Chang Wook Kang:
Degradation Analysis of Nano-Contamination in Plasma Display Panels.
IEEE Transactions on Reliability 57(2): 222-229 (2008) |
| 2007 |
| 1 |  | Suk Joo Bae,
Seong-Joon Kim,
Way Kuo,
Paul H. Kvam:
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
IEEE Transactions on Reliability 56(3): 392-400 (2007) |