Seok-Jin Kim

	2001
2		Tae-Jin Kwon, Sang-Hoon Lee, Tae-Seon Kim, Hoe-Jin Lee, Young-Kwan Park, Taek-Soo Kim, Seok-Jin Kim, Jeong-Taek Kong: Performance Improvement for High Speed Devices Using E-tests and the SPICE Model. ISQED 2001: 443-
	2000
1		Kwan-Do Kim, Young-Kwan Park, Jun-Ha Lee, Jeong-Taek Kong, Hee-Sung Kang, Young-Wug Kim, Seok-Jin Kim: Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. ISQED 2000: 87-

Coauthor Index

1	Hee-Sung Kang	[1]
2	Kwan-Do Kim	[1]
3	Tae-Seon Kim	[2]
4	Taek-Soo Kim	[2]
5	Young-Wug Kim	[1]
6	Jeong-Taek Kong	[1] [2]
7	Tae-Jin Kwon	[2]
8	Hoe-Jin Lee	[2]
9	Jun-Ha Lee	[1]
10	Sang-Hoon Lee	[2]
11	Young-Kwan Park	[1] [2]

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