Sang U. Kim

	2003
2		Young Pil Kim, U-In Chung, Joo Tae Moon, Sang U. Kim: Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. Microelectronics Reliability 43(9-11): 1461-1464 (2003)
	2001
1		Young Pil Kim, Beom Jun Jin, Young Wook Park, Joo Tae Moon, Sang U. Kim: Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. Microelectronics Reliability 41(9-10): 1301-1305 (2001)

Coauthor Index

1	U-In Chung	[2]
2	Beom Jun Jin	[1]
3	Young Pil Kim	[1] [2]
4	Joo Tae Moon	[1] [2]
5	Young Wook Park	[1]

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page