 | 2011 |
|---|
| 9 |       | Chang Hwan Peter Kim,
Don S. Batory,
Sarfraz Khurshid:
Reducing combinatorics in testing product lines.
AOSD 2011: 57-68 |
| 2010 |
|---|
| 8 | | Chang Hwan Peter Kim,
Don S. Batory,
Sarfraz Khurshid:
Eliminating products to test in a software product line.
ASE 2010: 139-142 |
| 7 | | Chang Hwan Peter Kim,
Eric Bodden,
Don S. Batory,
Sarfraz Khurshid:
Reducing Configurations to Monitor in a Software Product Line.
RV 2010: 285-299 |
| 2008 |
|---|
| 6 | | Chang Hwan Peter Kim,
Christian Kästner,
Don S. Batory:
On the modularity of feature interactions.
GPCE 2008: 23-34 |
| 2006 |
|---|
| 5 |  | Krzysztof Czarnecki,
Chang Hwan Peter Kim,
Karl Trygve Kalleberg:
Feature Models are Views on Ontologies.
SPLC 2006: 41-51 |
| 4 | | Krzysztof Czarnecki,
Michal Antkiewicz,
Chang Hwan Peter Kim:
Multi-level customization in application engineering.
Commun. ACM 49(12): 60-65 (2006) |
| 2005 |
|---|
| 3 | | Chang Hwan Peter Kim,
Krzysztof Czarnecki:
Synchronizing Cardinality-Based Feature Models and Their Specializations.
ECMDA-FA 2005: 331-348 |
| 2 | | Krzysztof Czarnecki,
Michal Antkiewicz,
Chang Hwan Peter Kim,
Sean Lau,
Krzysztof Pietroszek:
Model-driven software product lines.
OOPSLA Companion 2005: 126-127 |
| 1 | | Krzysztof Czarnecki,
Michal Antkiewicz,
Chang Hwan Peter Kim,
Sean Lau,
Krzysztof Pietroszek:
fmp and fmp2rsm: eclipse plug-ins for modeling features using model templates.
OOPSLA Companion 2005: 200-201 |
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