Byungwhan Kim

	2012
14		Byungwhan Kim, Daehyun Kim: Use of neural network to in situ conditioning of semiconductor plasma processing equipment. Appl. Soft Comput. 12(2): 826-831 (2012)
	2011
13		Byungwhan Kim, Sanghee Kwon: Wavelet-coupled backpropagation neural network as a chamber leak detector of plasma processing equipment. Expert Syst. Appl. 38(5): 6275-6280 (2011)
12		Su Jin Lee, Byungwhan Kim, Sung Wook Baik: Neural network modeling of inter-characteristics of silicon nitride film deposited by using a plasma-enhanced chemical vapor deposition. Expert Syst. Appl. 38(9): 11437-11441 (2011)
	2010
11		Byungwhan Kim, Sanghee Kwon, Donghwan Kim: Optimization of optical lens-controlled scanning electron microscopic resolution using generalized regression neural network and genetic algorithm. Expert Syst. Appl. 37(1): 182-186 (2010)
	2009
10		Byungwhan Kim, Hwajune Lee, Donghwan Kim: Modeling of Thin Film Process Data Using a Genetic Algorithm-Optimized Initial Weight of Backpropagation Neural Network. Applied Artificial Intelligence 23(2): 168-178 (2009)
9		Byungwhan Kim, Hee Ju Kwon, Seongjin Choi: Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl. 36(3): 6570-6573 (2009)
8		Byungwhan Kim, Jeong Kim, Seongjin Choi: Use of neural network to model X-ray photoelectron spectroscopy data for diagnosis of plasma etch equipment. Expert Syst. Appl. 36(8): 11347-11351 (2009)
	2007
7		Byungwhan Kim, Seongjin Choi: Adaptive Network-Based Fuzzy Inference Model of Plasma Enhanced Chemical Vapor Deposition Process. ISNN (1) 2007: 602-608
	2006
6		Byungwhan Kim, Dukwoo Lee, Seung Soo Han: Prediction of Plasma Enhanced Deposition Process Using GA-Optimized GRNN. ISNN (2) 2006: 1020-1027
5		Byungwhan Kim, Donghwan Kim, Seung Soo Han: Prediction of Radio Frequency Impedance Matching in Plasma Equipment Using Neural Network. ISNN (2) 2006: 1028-1035
4		Byungwhan Kim, Sooyoun Kim, Sang Jeen Hong: Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network. ISNN (2) 2006: 1036-1042
3		Byungwhan Kim, Wooram Ko, Seung Soo Han: Neural Network Recognition of Scanning Electron Microscope Image for Plasma Diagnosis. PRICAI 2006: 350-357
2		Byungwhan Kim, Jae Young Park, Donghwan Kim, Seung Soo Han: Diagnosis Model of Radio Frequency Impedance Matching in Plasma Equipment by Using Neural Network and Wavelets. PRICAI 2006: 995-999
	2002
1		Byungwhan Kim, Jang Hyun Park, Beom-Soo Kim: Fuzzy Logic Model of Langmuir Probe Discharge Data. Computers & Chemistry 26(6): 573-581 (2002)

Coauthor Index

1	Sung Wook Baik (Sung Baik)	[12]
2	Seongjin Choi	[7] [8] [9]
3	Seung Soo Han	[2] [3] [5] [6]
4	Sang Jeen Hong	[4]
5	Beom-Soo Kim	[1]
6	Daehyun Kim (Dae Hyun Kim)	[14]
7	Donghwan Kim	[2] [5] [10] [11]
8	Jeong Kim	[8]
9	Sooyoun Kim	[4]
10	Wooram Ko	[3]
11	Hee Ju Kwon	[9]
12	Sanghee Kwon	[11] [13]
13	Dukwoo Lee	[6]
14	Hwajune Lee	[10]
15	Su Jin Lee	[12]
16	Jae Young Park	[2]
17	Jang Hyun Park	[1]

Colors in the list of coauthors

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