 | 2011 |
|---|
| 7 |       | Byoungho Kim,
Jacob A. Abraham:
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications.
IEEE T. Instrumentation and Measurement 60(6): 2014-2024 (2011) |
| 6 | | Byoungho Kim,
Jacob A. Abraham:
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.
IEEE Trans. on Circuits and Systems 58-I(8): 1773-1784 (2011) |
| 2008 |
|---|
| 5 | | Byoungho Kim,
Nash Khouzam,
Jacob A. Abraham:
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.
VTS 2008: 293-298 |
| 2007 |
|---|
| 4 | | Byoungho Kim,
Zhenhai Fu,
Jacob A. Abraham:
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications.
VTS 2007: 291-296 |
| 3 | | Byoungho Kim,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Predicting mixed-signal dynamic performance using optimised signature-based alternate test.
IET Computers & Digital Techniques 1(3): 159-169 (2007) |
| 2006 |
|---|
| 2 | | Byoungho Kim,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters.
European Test Symposium 2006: 199-204 |
| 1 | | Hongjoong Shin,
Byoungho Kim,
Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
VTS 2006: 412-419 |
Data released under the ODC-BY 1.0 license — See also our legal information page