Bruce C. Kim

	2012
49		Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn: Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects. J. Electronic Testing 28(1): 39-51 (2012)
	2011
48		Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force: Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electronic Testing 27(3): 241-252 (2011)
	2010
47		Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed: RADPro: Automatic RF analyzer and diagnostic program generation tool. ITC 2010: 325-333
	2009
46		Sukeshwar Kannan, Bruce C. Kim: Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. ITC 2009: 1
	2008
45		Bruce C. Kim: TTTC Newsletter. IEEE Design & Test of Computers 25(1): 103 (2008)
44		Bruce C. Kim, Craig Force: Guest Editors' Introduction: The Evolution of RFIC Design and Test. IEEE Design & Test of Computers 25(1): 6-8 (2008)
43		Bruce C. Kim: TTTC Newsletter. IEEE Design & Test of Computers 25(2): 198-199 (2008)
	2007
42		Srividya Sundar, Bruce C. Kim, Toby Byrd, Felipe Toledo, Sudhir Wokhlu, Erika Beskar, Raul Rousselin, David Cotton, Gary Kendall: Low cost automatic mixed-signal board test using IEEE 1149.4. ITC 2007: 1-9
41		Bruce C. Kim: TTTC Newsletter. IEEE Design & Test of Computers 24(1): 97 (2007)
40		Bruce C. Kim: Test Technology TC Newsletter. IEEE Design & Test of Computers 24(2): 197 (2007)
39		Bruce C. Kim: TTTC Newsletter. IEEE Design & Test of Computers 24(3): 292 (2007)
38		Bruce C. Kim: TTTC Newsletter. IEEE Design & Test of Computers 24(4): 407 (2007)
37		Bruce C. Kim: TTTC Newsletter. IEEE Design & Test of Computers 24(5): 511 (2007)
36		Bruce C. Kim: TTTC Newsletter. IEEE Design & Test of Computers 24(6): 605 (2007)
35		Bruce C. Kim: Test Technology Newsletter. J. Electronic Testing 23(1): 9-10 (2007)
34		Bruce C. Kim: Test Technology Newsletter April 2007. J. Electronic Testing 23(2-3): 113-114 (2007)
33		Bruce C. Kim: Test Technology Newsletter - October 2007. J. Electronic Testing 23(5): 371-372 (2007)
32		Bruce C. Kim: Test Technology Newsletter - December 2007. J. Electronic Testing 23(6): 467-468 (2007)
	2006
31		Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal: DIBPro: Automatic Diagnostic Program Generation Tool. ITC 2006: 1-8
30		Yervant Zorian, Bruce C. Kim: Session Abstract. VTS 2006: 334-335
29		Bruce C. Kim, Yervant Zorian: Guest Editors' Introduction: Big Innovations in Small Packages. IEEE Design & Test of Computers 23(3): 186-187 (2006)
28		Bruce C. Kim: Test Technology Technical Council Newsletter. IEEE Design & Test of Computers 23(3): 250 (2006)
27		Bruce C. Kim: Test Technology TC Newsletter. IEEE Design & Test of Computers 23(4): 320-323 (2006)
26		Bruce C. Kim: Test Technology TC Newsletter. IEEE Design & Test of Computers 23(5): 425 (2006)
25		Bruce C. Kim: TTTC Newsletter. IEEE Design & Test of Computers 23(6): 507 (2006)
24		Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla: A new low-cost RF built-in self-test measurement for system-on-chip transceivers. IEEE T. Instrumentation and Measurement 55(2): 381-388 (2006)
23		Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla: A Novel RF Test Scheme Based on a DFT Method. J. Electronic Testing 22(3): 229-237 (2006)
	2005
22		Rahim Kasim, Bruce C. Kim, Josef Drobnik: Advanced Mems for High Power Integrated Distribution Systems. ICMENS 2005: 247-254
21		Bruce C. Kim: Test Technology Technical Council Newsletter. J. Electronic Testing 21(2): 113-114 (2005)
20		Bruce C. Kim: Test Technology Technical Council Newsletter. J. Electronic Testing 21(3): 201 (2005)
19		Bruce C. Kim: The Newsletter of Test Technology Council of the IEEE Computer Society. J. Electronic Testing 21(5): 461-462 (2005)
18		Jee-Youl Ryu, Bruce C. Kim: Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. J. Electronic Testing 21(6): 571-581 (2005)
17		Jee-Youl Ryu, Bruce C. Kim: Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. Microelectronics Journal 36(8): 770-777 (2005)
	2003
16		Kranthi K. Pinjala, Bruce C. Kim: An Approach for Selection of Test Points for Analog Fault Diagnosis. DFT 2003: 287-294
15		Kee-Keun Lee, Bruce C. Kim: RF MEMS Switch for Wireless LAN Applications. ICMENS 2003: 100-102
14		Kee-Keun Lee, Bruce C. Kim: MEMS Spring Probe for Next Generation Wafer Level Testing. ICMENS 2003: 214-217
13		Kee-Keun Lee, Jiping He, Amarjit Singh, Bruce C. Kim: Benzocyclobutene (BCB) Based Intracortical Neural Implant. ICMENS 2003: 418-422
12		Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam: Automatic Diagnostic Program Generation for Mixed Signal Load Board. ITC 2003: 403-409
	1999
11		Bruce C. Kim, Pinshan Jiang, Se Hyun Park: A probe scheduling algorithm for MCM substrates. ITC 1999: 31-37
10		Bruce C. Kim, Krishna Marella: A Novel Test Methodology for MEMS Magnetic Micromotors. VTS 1999: 284-289
	1998
9		Bruce C. Kim, David C. Keezer, Abhijit Chatterjee: A high throughput test methodology for MCM substrates. ITC 1998: 234-240
8		Rongchang Yan, Bruce C. Kim: A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Prob. VTS 1998: 266-273
	1997
7		Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee: A Survey of Test Techniques for MCM Substrates. J. Electronic Testing 10(1-2): 27-38 (1997)
	1996
6		Bruce C. Kim, Hisao Fujikawa, Tetsuji Tamaka: An integrated network management system: the design for AIN and B-ISDN. NOMS 1996: 604-607
5		Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi: Low-cost DC built-in self-test of linear analog circuits using checksums. VLSI Design 1996: 230-233
4		Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan: Low-cost diagnosis of defects in MCM substrate interconnections. VTS 1996: 260-265
3		Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi: DC Built-In Self-Test for Linear Analog Circuits. IEEE Design & Test of Computers 13(2): 26-33 (1996)
	1995
2		Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel: A Novel Low-Cost Approach to MCM Interconnect Test. ITC 1995: 184-192
	1994
1		Paul J. Bond, Bruce C. Kim, Christopher A. Lee, David E. Schimmel: A Methodology for Generation and Collection of Multiprocessor Traces. MASCOTS 1994: 417-418

Coauthor Index

1	Byoungchul Ahn	[49]
2	Richard Antley	[47] [48]
3	Erika Beskar	[42]
4	Paul J. Bond	[1]
5	Toby Byrd	[42]
6	Abhijit Chatterjee	[2] [3] [4] [5] [7] [9]
7	Sasikumar Cherubal	[31]
8	David Cotton	[42]
9	Josef Drobnik	[22]
10	Craig Force	[44] [47] [48]
11	Hisao Fujikawa	[6]
12	Jiping He	[13]
13	Pinshan Jiang	[11]
14	Venkat Kalyanaraman	[31]
15	Sukeshwar Kannan	[46] [47] [48] [49]
16	Rahim Kasim	[22]
17	David C. Keezer	[9]
18	Gary Kendall	[42]
19	Christopher A. Lee	[1]
20	Kee-Keun Lee	[13] [14] [15]
21	Krishna Marella	[10]
22	Falah Mohammed	[47]
23	Naveena Nagi	[3] [5]
24	Se Hyun Park	[11]
25	Kranthi K. Pinjala	[12] [16]
26	Raul Rousselin	[42]
27	Jee-Youl Ryu	[17] [18] [23] [24]
28	David E. Schimmel	[1] [2]
29	Amarjit Singh	[13]
30	Ganesh Srinivasan	[47] [48]
31	Srividya Sundar	[42]
32	Madhavan Swaminathan	[2] [4] [7]
33	Iboun Taimiya Sylla	[23] [24]
34	Friedrich Taenzler (Friedrich Taenzlar)	[47] [48]
35	Tetsuji Tamaka	[6]
36	Felipe Toledo	[42]
37	Pramodchandran N. Variyam	[12] [31]
38	Sudhir Wokhlu	[42]
39	Rongchang Yan	[8]
40	Yervant Zorian	[29] [30]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page