 | 2011 |
|---|
| 5 |       | Lilia Zaourar,
Yann Kieffer,
Chouki Aktouf:
An Innovative Methodology for Scan Chain Insertion and Analysis at RTL.
Asian Test Symposium 2011: 66-71 |
| 4 | | Lilia Zaourar,
Yann Kieffer,
Arnaud Wenzel:
A multi-objective optimization for memory BIST sharing using a genetic algorithm.
IOLTS 2011: 73-78 |
| 3 | | Lilia Zaourar,
Yann Kieffer,
Chouki Aktouf:
A Global Optimization for Scan Chain Insertion at the RT-level.
ISVLSI 2011: 321-322 |
| 2010 |
|---|
| 2 | | Lilia Zaourar,
Jihane Alami Chentoufi,
Yann Kieffer,
Arnaud Wenzel,
Frederic Grandvaux:
A shared BIST optimization methodology for memory test.
European Test Symposium 2010: 255 |
| 2003 |
|---|
| 1 | | Yann Kieffer:
The facets of the polytope of modules of a graph.
Oper. Res. Lett. 31(3): 435-441 (2003) |
Data released under the ODC-BY 1.0 license — See also our legal information page