S. Saqib Khursheed

	2011
16		Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi: Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs. Asian Test Symposium 2011: 201-206
15		Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Krishnendu Chakrabarty: Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. Asian Test Symposium 2011: 389-394
14		S. Saqib Khursheed, Sheng Yang, Bashir M. Al-Hashimi, Xiaoyu Huang, David Flynn: Improved DFT for Testing Power Switches. European Test Symposium 2011: 7-12
13		Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi: A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects. IEEE Trans. on CAD of Integrated Circuits and Systems 30(11): 1719-1730 (2011)
12		Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Sachin Idgunji: Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE Trans. on CAD of Integrated Circuits and Systems 30(12): 1773-1785 (2011)
	2010
11		Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed: Scan based methodology for reliable state retention power gating designs. DATE 2010: 69-74
10		S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu: Modeling the impact of process variation on resistive bridge defects. ITC 2010: 295-304
9		S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty, Peter Harrod: Gate-Sizing-Based Single Vdd Test for Bridge Defects in Multivoltage Designs. IEEE Trans. on CAD of Integrated Circuits and Systems 29(9): 1409-1421 (2010)
	2009
8		S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod: Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. DATE 2009: 1349-1354
7		S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod: Diagnosis of Multiple-Voltage Design With Bridge Defect. IEEE Trans. on CAD of Integrated Circuits and Systems 28(3): 406-416 (2009)
6		Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod: Process Variation-Aware Test for Resistive Bridges. IEEE Trans. on CAD of Integrated Circuits and Systems 28(8): 1269-1274 (2009)
	2008
5		S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod: Bridge Defect Diagnosis for Multiple-Voltage Design. European Test Symposium 2008: 99-104
4		S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosinger, Bashir M. Al-Hashimi, Peter Harrod: Bridging Fault Test Method With Adaptive Power Management Awareness. IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1117-1127 (2008)
	2007
3		Aiman El-Maleh, S. Saqib Khursheed: Efficient test compaction for combinational circuits based on Fault detection count-directed clustering. IET Computers & Digital Techniques 1(4): 364-368 (2007)
	2006
2		Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait: Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2556-2564 (2006)
	2005
1		Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait: Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation. Asian Test Symposium 2005: 378-385

Coauthor Index

1	Robert C. Aitken (Rob Aitken)	[10]
2	Bashir M. Al-Hashimi	[4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16]
3	Krishnendu Chakrabarty	[9] [15]
4	Aiman H. El-Maleh (Aiman El-Maleh)	[1] [2] [3]
5	David Flynn	[11] [12] [14]
6	Peter Harrod	[4] [5] [6] [7] [8] [9]
7	Xiaoyu Huang	[14]
8	Sachin Idgunji	[12]
9	Urban Ingelsson	[4] [6]
10	Sandip Kundu	[10]
11	Sudhakar M. Reddy	[5] [6] [7] [15]
12	Paul M. Rosinger	[4] [5]
13	Sadiq M. Sait	[1] [2]
14	Sheng Yang	[11] [12] [14]
15	Yi Zhao	[16]
16	Shida Zhong	[10] [13] [15]

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page