B. Khong

	2007
2		B. Khong, M. Legros, P. Tounsi, Ph. Dupuy, X. Chauffleur, C. Levade, G. Vanderschaeve, E. Scheid: Characterization and modelling of ageing failures on power MOSFET devices. Microelectronics Reliability 47(9-11): 1735-1740 (2007)
	2005
1		B. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J. M. Dorkel, J. P. Fradin: Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectronics Reliability 45(9-11): 1717-1722 (2005)

Coauthor Index

1	X. Chauffleur	[1] [2]
2	A. Deram	[1]
3	J. M. Dorkel	[1]
4	Ph. Dupuy	[1] [2]
5	J. P. Fradin	[1]
6	M. Legros	[1] [2]
7	C. Levade	[1] [2]
8	E. Scheid	[2]
9	P. Tounsi	[1] [2]
10	G. Vanderschaeve	[1] [2]

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