Ajay Khoche

	2010
20		Jim O'Reilly, Ajay Khoche, Ernst Wahl, Bruce R. Parnas: STIL P1450.4: A standard for test flow specification. ITC 2010: 506-515
	2009
19		Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Song-lin Zuo, Liyang Lai, John Rowe, Thomas Zanon: STDF Memory Fail Datalog Standard. VTS 2009: 209-214
	2008
18		Ajay Khoche, Phil Burlison, John Rowe, Glenn Plowman: A Tutorial on STDF Fail Datalog Standard. ITC 2008: 1-10
	2006
17		Ajay Khoche, Domenico Chindamo, Michael Braun, Martin Fischer: Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics. ITC 2006: 1-10
16		Ajay Khoche: Session Abstract. VTS 2006: 152-153
15		Ajay Khoche, Peter Muhmenthaler: Session Abstract. VTS 2006: 288-289
14		Ajay Khoche, Mike Rodgers, Pete O'Neil: Session Abstract. VTS 2006: 426
13		Ajay Khoche: Panel Summaries: Real-Time Volume Diagnostics--Requirements and Challenges. IEEE Design & Test of Computers 23(4): 315 (2006)
	2003
12		Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus D. Hilliges: Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. J. Electronic Testing 19(2): 125-135 (2003)
	2002
11		Erik H. Volkerink, Ajay Khoche, Subhasish Mitra: Packet-Based Input Test Data Compression Techniques. ITC 2002: 154-163
10		Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus D. Hilliges: Test Economics for Multi-site Test with Modern Cost Reduction Techniques. VTS 2002: 411-416
9		Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra: Test Vector Compression Using EDA-ATE Synergies. VTS 2002: 97-102
	2001
8		Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff: Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC 2001: 1098-1107
7		Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir: A new methodology for improved tester utilization. ITC 2001: 916-923
	1997
6		Ajay Khoche, Erik Brunvand: ACT: A DFT Tool for Self-Timed Circuits. ITC 1997: 829-837
5		Ajay Khoche, Erik Brunvand: Critical hazard free test generation for asynchronous circuits. VTS 1997: 203-209
	1995
4		Ajay Khoche, Erik Brunvand: Testing self-timed circuits using partial scan. ASYNC 1995: 160-169
3		Sandeep Pagey, Ajay Khoche, Erik Brunvand: DFT for fast testing of self-timed control circuits. Asian Test Symposium 1995: 382-386
2		Ajay Khoche, Erik Brunvand: A partial scan methodology for testing self-timed circuits. VTS 1995: 283-289
	1992
1		Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh, Raja Venkateswaran: A Behavioral Fault Simulator for Ideal. IEEE Design & Test of Computers 9(4): 14-21 (1992)

Coauthor Index

1	Neetu Agrawal	[19]
2	David Armstrong	[7]
3	Michael Braun	[17]
4	Erik Brunvand	[2] [3] [4] [5] [6]
5	Phil Burlison	[18]
6	Domenico Chindamo	[17]
7	Martin Fischer	[17]
8	Klaus D. Hilliges	[10] [12]
9	Linda A. Kamas	[8]
10	Rohit Kapur	[7]
11	Jay Katz	[19]
12	Hans G. Kerkhoff	[8]
13	Liyang Lai	[19]
14	Sauro Landini	[19]
15	Kochen Liao	[19]
16	Subhasish Mitra	[9] [11]
17	Peter Muhmenthaler	[15]
18	Pete O'Neil	[14]
19	Jim O'Reilly	[20]
20	Sandeep Pagey	[3]
21	Bruce R. Parnas	[20]
22	Glenn Plowman	[18] [19]
23	Jochen Rivoir	[7] [8] [9] [10] [12]
24	Mike Rodgers	[14]
25	John Rowe	[18] [19]
26	Sunil D. Sherlekar	[1]
27	Mick Tegethoff	[7]
28	G. Venkatesh	[1]
29	Raja Venkateswaran	[1]
30	Erik H. Volkerink	[8] [9] [10] [11] [12]
31	Ernst Wahl	[20]
32	Thomas W. Williams	[7]
33	Thomas Zanon	[19]
34	Song-lin Zuo	[19]

Colors in the list of coauthors

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