Michael G. Khazhinsky

	2007
4		Michael G. Khazhinsky: ESD protection strategies in advanced CMOS SOI ICs. Microelectronics Reliability 47(9-11): 1313-1321 (2007)
	2005
3		Michael Stockinger, James W. Miller, Michael G. Khazhinsky, Cynthia A. Torres, James C. Weldon, Bryan D. Preble, Martin J. Bayer, Matthew D. Akers, Vishnu G. Kamat: Advanced rail clamp networks for ESD protection. Microelectronics Reliability 45(2): 211-222 (2005)
	2002
2		Cynthia A. Torres, James W. Miller, Michael Stockinger, Matthew D. Akers, Michael G. Khazhinsky, James C. Weldon: Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologies. Microelectronics Reliability 42(6): 873-885 (2002)
	2001
1		James W. Miller, Michael G. Khazhinsky, James C. Weldon: Layout and bias options for maximizing Vt1 in cascoded NMOS output buffers. Microelectronics Reliability 41(11): 1751-1760 (2001)

Coauthor Index

1	Matthew D. Akers	[2] [3]
2	Martin J. Bayer	[3]
3	Vishnu G. Kamat	[3]
4	James W. Miller	[1] [2] [3]
5	Bryan D. Preble	[3]
6	Michael Stockinger	[2] [3]
7	Cynthia A. Torres	[2] [3]
8	James C. Weldon	[1] [2] [3]

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