Mohammad Athar Khalil

	2004
3		Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba: Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. ACM Great Lakes Symposium on VLSI 2004: 322-327
	2001
2		Mohammad Athar Khalil, Chin-Long Wey: Extreme-voltage stress vector generation of analog CMOS ICs for gate-oxide reliability enhancement. ITC 2001: 348-357
1		Mohammad Athar Khalil, Chin-Long Wey: High-Voltage Stress Test Paradigms of Analog CMOS ICs for Gate-Oxide Reliability Enhancement. VTS 2001: 333-338

Coauthor Index

1	Jim Liu	[3]
2	Chin-Long Wey	[1] [2] [3]
3	Gregory Wierzba	[3]

Last update Sat Jun 2 20:57:36 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page