Vincent Kerzerho

	2011
9		Vincent Kerzerho, Vincent Fresnaud, Dominique Dallet, Serge Bernard, Lilian Bossuet: Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter. IEEE T. Instrumentation and Measurement 60(3): 768-775 (2011)
8		Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell: Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electronic Testing 27(3): 335-350 (2011)
	2010
7		Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff: Predicting dynamic specifications of ADCs with a low-quality digital input signal. European Test Symposium 2010: 158-163
	2008
6		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib: ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: (2008)
	2007
5		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2007: 211-216
4		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Computers & Digital Techniques 1(3): 146-153 (2007)
	2006
3		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2006: 159-164
2		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Design & Test of Computers 23(3): 234-243 (2006)
1		Vincent Kerzerho, Serge Bernard, Philippe Cauvet, Jean-Marie Janik: A First Step for an INL Spectral-Based BIST: The Memory Optimization. J. Electronic Testing 22(4-6): 351-357 (2006)

Coauthor Index

1	Florence Azaïs	[2] [3] [4] [5] [6] [8]
2	Serge Bernard	[1] [2] [3] [4] [5] [6] [8] [9]
3	Lilian Bossuet	[9]
4	Philippe Cauvet	[1] [2] [3] [4] [5] [6] [8]
5	Omar Chakib	[6]
6	Mariane Comte	[2] [3] [4] [5] [6] [8]
7	Dominique Dallet	[9]
8	Vincent Fresnaud	[9]
9	Jean-Marie Janik	[1]
10	Hans G. Kerkhoff	[7]
11	Michel Renovell	[2] [3] [4] [5] [6] [8]
12	Xiaoqin Sheng	[7]

Colors in the list of coauthors

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