Uwe Kerst

	2010
9		P. Scholz, C. Gallrapp, Uwe Kerst, Ted Lundquist, Christian Boit: Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments. Microelectronics Reliability 50(9-11): 1441-1445 (2010)
	2009
8		Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Ted Lundquist, Peter Egger, Christian Boit: Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. Microelectronics Reliability 49(9-11): 1158-1164 (2009)
	2008
7		Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted Lundquist: Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. IEEE Design & Test of Computers 25(3): 250-257 (2008)
6		Ulrike Kindereit, Christian Boit, Uwe Kerst, Steven Kasapi, Radu Ispasoiu, Roy Ng, William K. Lo: Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. Microelectronics Reliability 48(8-9): 1322-1326 (2008)
	2007
5		Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted Lundquist, Bernd Krüger: Backside E-Beam Probing on Nano scale devices. ITC 2007: 1-9
4		Rudolf Schlangen, Uwe Kerst, Christian Boit, Tahir Malik, Rajesh Jain, Ted Lundquist: Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy. Microelectronics Reliability 47(9-11): 1523-1528 (2007)
	2006
3		Rudolf Schlangen, Peter Sadewater, Uwe Kerst, Christian Boit: Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node. Microelectronics Reliability 46(9-11): 1498-1503 (2006)
	2005
2		Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted Lundquist, Siegfried Pauthner: Impact of back side circuit edit on active device performance in bulk silicon ICs. ITC 2005: 9
1		Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit: Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectronics Reliability 45(9-11): 1544-1549 (2005)

Coauthor Index

1	Christian Boit	[1] [3] [4] [5] [6] [7] [8] [9]
2	Peter Egger	[8]
3	C. Gallrapp	[9]
4	Radu Ispasoiu	[6]
5	Rajesh Jain	[4] [5]
6	A. Kabakow	[1] [2]
7	Steven Kasapi	[6]
8	Ulrike Kindereit	[6]
9	Bernd Krüger	[5]
10	Reiner Leihkauf	[5] [8]
11	William K. Lo	[6]
12	Ted Lundquist	[2] [4] [5] [7] [8] [9]
13	Tahir Malik	[4] [5]
14	Roy Ng	[6]
15	Siegfried Pauthner	[2]
16	Erwan Le Roy	[2]
17	Peter Sadewater	[3]
18	Rudolf Schlangen	[1] [2] [3] [4] [5] [7] [8]
19	P. Scholz	[9]
20	Keneth R. Wilsher	[5]

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