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| 2005 | ||
|---|---|---|
| 4 | Selahattin Sayil, David V. Kerns, Sherra E. Kerns: Comparison of contactless measurement and testing techniques to a all-silicon optical test and characterization method. IEEE T. Instrumentation and Measurement 54(5): 2082-2089 (2005) | |
| 2002 | ||
| 3 | David V. Kerns, Sherra E. Kerns, Gill A. Pratt, Mark H. Somerville, Jill D. Crisman: The Search for Design in Electrical Engineering Education. DELTA 2002: 192-196 | |
| 1993 | ||
| 2 | Venkata S. Rangavajjhala, Bharat L. Bhuva, Sherra E. Kerns: Statistical degradation analysis of digital CMOS IC's. IEEE Trans. on CAD of Integrated Circuits and Systems 12(6): 837-844 (1993) | |
| 1989 | ||
| 1 | Bharat L. Bhuva, John J. Paulos, Ronald S. Gyurcsik, Sherra E. Kerns: Switch-level simulation of total dose effects on CMOS VLSI circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 8(9): 933-938 (1989) | |
Colors in the list of coauthors
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