Todd P. Kelsey

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1993

1 Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee: An Efficient Algorithm for Sequential Circuit Test Generation. IEEE Trans. Computers 42(11): 1361-1371 (1993)

	1993
1		Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee: An Efficient Algorithm for Sequential Circuit Test Generation. IEEE Trans. Computers 42(11): 1361-1371 (1993)

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