David C. Keezer

	2011
44		Carl Gray, David C. Keezer, H. Wang, Keren Bergman: Burst-Mode Transmission and Data Recovery for Multi-GHz Optical Packet Switching Network Testing. Asian Test Symposium 2011: 545-551
43		David C. Keezer, Carl Edward Gray: Two methods for 24 Gbps test signal synthesis. DATE 2011: 579-582
42		A. M. Majid, David C. Keezer: Multi-function multi-GHz ATE extension using state-of-the-art FPGAs. ITC 2011: 1-10
41		Carl Edward Gray, David C. Keezer: Extending a DWDM Optical Network Test System to 12 Gbps x4 Channels. J. Electronic Testing 27(3): 351-361 (2011)
	2010
40		A. M. Majid, David C. Keezer: Stretching the limits of FPGA SerDes for enhanced ATE performance. DATE 2010: 202-207
39		Marcus Dutton, David C. Keezer: An architecture for graphics processing in an FPGA (abstract only). FPGA 2010: 283
38		David C. Keezer, Carl Gray, Dany Minier, Patrice Ducharme: Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic. J. Electronic Testing 26(1): 87-96 (2010)
	2009
37		David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme: A development platform and electronic modules for automated test up to 20 Gbps. ITC 2009: 1-11
	2008
36		David C. Keezer, Dany Minier, Patrice Ducharme: Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications. DATE 2008: 1486-1491
35		David C. Keezer, Dany Minier, Patrice Ducharme, A. M. Majid: An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test. ITC 2008: 1-9
34		David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop: MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing. VLSI Design 2008: (2008)
	2007
33		David C. Keezer, Dany Minier, Patrice Ducharme: Method for reducing jitter in multi-gigahertz ATE. DATE 2007: 701-706
32		David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop: Multi-GHz loopback testing using MEMs switches and SiGe logic. ITC 2007: 1-10
31		Carl Edward Gray, Odile Liboiron-Ladouceur, David C. Keezer, Keren Bergman: Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network. ITC 2007: 1-9
30		David C. Keezer, Carl Gray, A. M. Majid, N. Taher: Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL CoRR abs/0710.4761: (2007)
	2006
29		A. M. Majid, David C. Keezer, Jayasanker Jayabalan, Mihai Rotaru: Multi-Gigahertz Testing of Wafer-Level Packaged Devices. ITC 2006: 1-10
28		David C. Keezer, Dany Minier, Patrice Ducharme: Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses. IEEE Design & Test of Computers 23(1): 46-57 (2006)
	2005
27		A. M. Majid, David C. Keezer, J. V. Karia: A 5 Gbps Wafer-Level Tester. Asian Test Symposium 2005: 58-63
26		David C. Keezer, Carl Gray, A. M. Majid, N. Taher: Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL. DATE 2005: 152-157
	2004
25		David C. Keezer, Dany Minier, F. Binette: Modular Extension of ATE to 5 Gbps. ITC 2004: 748-757
24		David C. Keezer, Dany Minier, Marie-Christine Caron: Multiplexing ATE Channels for Production Testing at 2.5 Gbps. IEEE Design & Test of Computers 21(4): 288-301 (2004)
	2003
23		J. S. Davis, David C. Keezer, Odile Liboiron-Ladouceur, Keren Bergman: Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ITC 2003: 166-174
22		David C. Keezer, Dany Minier, Marie-Christine Caron: A Production-Oriented Multiplexing System for Testing above 2.5 Gbps. ITC 2003: 191-200
	2002
21		David C. Keezer: Challenges and Solutions for Multi-Gigahertz Testing. ITC 2002: 1230
20		J. S. Davis, David C. Keezer: Multi-Purpose Digital Test Core Utilizing Programmable Logic. ITC 2002: 438-445
19		Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei: Multi-GigaHertz Testing Challenges and Solutions. VTS 2002: 265-268
	2001
18		David C. Keezer, Q. Zhou, C. Bair, J. Kuan, B. Poole: Terabit-per-second automated digital testing. ITC 2001: 1143-1151
	1999
17		David C. Keezer, Q. Zhou: Test support processors for enhanced testability of high performance circuits. ITC 1999: 801-809
	1998
16		David C. Keezer, K. E. Newman, J. S. Davis: Improved sensitivity for parallel test of substrate interconnections. ITC 1998: 228-233
15		Bruce C. Kim, David C. Keezer, Abhijit Chatterjee: A high throughput test methodology for MCM substrates. ITC 1998: 234-240
14		David C. Keezer, Q. Zhou: Alternative interface methods for testing high speed bidirectional signals. ITC 1998: 824-830
	1997
13		K. E. Newman, David C. Keezer: A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. ITC 1997: 370-378
12		David C. Keezer, R. J. Wenzel: Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. ITC 1997: 94-100
	1995
11		David C. Keezer: Electrical Troubleshooting, Diagnostics, and Repair of Multichip Modules. ITC 1995: 917
	1993
10		N. Ranganathan, Raghu Sastry, R. Venkatesan, Joseph W. Yoder, David C. Keezer: SMAC: A Scene Matching Chip. ICCD 1993: 184-187
9		David C. Keezer: Known Godd Die for MCMs: Enabling Technologies. ITC 1993: 266
	1992
8		David C. Keezer: MCM Test Using Available Technology. ITC 1992: 253
7		David C. Keezer, R. J. Wenzel: Calibration Techniques for a Gigahertz Test System. ITC 1992: 530-537
6		Vijay K. Jain, Hiroomi Hikawa, David C. Keezer: An Architecture for WSI Rapid Prototyping. IEEE Computer 25(4): 71-75 (1992)
	1991
5		S. P. Athan, David C. Keezer, J. McKinley: High Frequency Wafer Probing and Power Supply Resonance Effects. ITC 1991: 1069-1078
4		David C. Keezer: Real-Time Data Comparison for GigaHertz Digital Test. ITC 1991: 790-797
3		Vijay K. Jain, David L. Landis, David C. Keezer, K. T. Wilson, D. Whittaker: Wafer Scale Integration: A university perspective. VLSI Signal Processing 2(4): 253-269 (1991)
	1990
2		David C. Keezer: Multiplexing test system channels for data rates above 1 Gb/s. ITC 1990: 362-368
	1985
1		L. J. Falkenstrom, David C. Keezer, A. Patterson, Robert M. Rolfe, J. Wolcott: Tester Independent Support Software System (TISSS). ITC 1985: 685-691

Coauthor Index

1	Karim Arabi	[19]
2	S. P. Athan	[5]
3	C. Bair	[18]
4	Keren Bergman	[23] [31] [44]
5	F. Binette	[25]
6	Marie-Christine Caron	[22] [24]
7	Abhijit Chatterjee	[15]
8	J. S. Davis	[16] [20] [23]
9	Patrice Ducharme	[28] [32] [33] [34] [35] [36] [37] [38]
10	Marcus Dutton	[39]
11	L. J. Falkenstrom	[1]
12	Greg Flynn	[32] [34]
13	Carl Gray	[26] [30] [37] [38] [44]
14	Carl Edward Gray	[31] [41] [43]
15	Hiroomi Hikawa	[6]
16	Klaus-Dieter Hilliges	[19]
17	Vijay K. Jain	[3] [6]
18	Jayasanker Jayabalan	[29]
19	J. V. Karia	[27]
20	Bruce C. Kim	[15]
21	J. Kuan	[18]
22	David L. Landis	[3]
23	Odile Liboiron-Ladouceur	[23] [31]
24	A. M. Majid	[26] [27] [29] [30] [35] [37] [40] [42]
25	John McKillop	[32] [34]
26	J. McKinley	[5]
27	Dany Minier	[22] [24] [25] [28] [32] [33] [34] [35] [36] [37] [38]
28	K. E. Newman	[13] [16]
29	A. Patterson	[1]
30	B. Poole	[18]
31	N. Ranganathan (Nagarajan Ranganathan)	[10]
32	Robert M. Rolfe	[1]
33	Mihai Rotaru	[29]
34	Raghu Sastry	[10]
35	Sassan Tabatabaei	[19]
36	N. Taher	[26] [30]
37	R. Venkatesan	[10]
38	Doris Viens	[32] [34]
39	H. Wang	[44]
40	R. J. Wenzel	[7] [12]
41	D. Whittaker	[3]
42	K. T. Wilson	[3]
43	J. Wolcott	[1]
44	Joseph W. Yoder	[10]
45	Q. Zhou	[14] [17] [18]

Colors in the list of coauthors

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