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| 2001 | ||
|---|---|---|
| 1 | John T. Chen, Wojciech Maly, Janusz Rajski, Omar Kebichi, Jitendra Khare: Enabling Embedded Memory Diagnosis via Test Response Compression. VTS 2001: 292-298 | |
| 1 | John T. Chen | [1] |
| 2 | Jitendra Khare | [1] |
| 3 | Wojciech Maly | [1] |
| 4 | Janusz Rajski | [1] |
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