Sammy Kayali

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2005

2 Yuan Chen, Qing Wang, Sammy Kayali: A statistical approach to characterizing the reliability of systems utilizing HBT devices. Microelectronics Reliability 45(12): 1869-1874 (2005)

2000

1 Sammy Kayali: Reliability Considerations for Advanced Microelectronics. PRDC 2000: 99-102

	2005
2		Yuan Chen, Qing Wang, Sammy Kayali: A statistical approach to characterizing the reliability of systems utilizing HBT devices. Microelectronics Reliability 45(12): 1869-1874 (2005)
	2000
1		Sammy Kayali: Reliability Considerations for Advanced Microelectronics. PRDC 2000: 99-102

Coauthor Index

1 Yuan Chen [2]

2 Qing Wang [2]

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team —

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