Xrysovalantis Kavousianos

	2011
44		Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji: Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and Multiple Voltage Islands. Asian Test Symposium 2011: 33-39
43		Vasileios Tenentes, Xrysovalantis Kavousianos: Low Power Test-Compression for High Test-Quality and Low Test-Data Volume. Asian Test Symposium 2011: 46-53
42		Zhaobo Zhang, Xrysovalantis Kavousianos, Yan Luo, Yiorgos Tsiatouhas, Krishnendu Chakrabarty: Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches. European Test Symposium 2011: 13-18
41		Vasileios Tenentes, Xrysovalantis Kavousianos: Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs. ICCAD 2011: 747-754
40		Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty: A BIST scheme for testing and repair of multi-mode power switches. IOLTS 2011: 115-120
39		Zhaobo Zhang, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Yiorgos Tsiatouhas: A Robust and Reconfigurable Multi-mode Power Gating Architecture. VLSI Design 2011: 280-285
38		Xrysovalantis Kavousianos, Vasileios Tenentes, Krishnendu Chakrabarty, Emmanouil Kalligeros: Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. IEEE Trans. VLSI Syst. 19(12): 2330-2335 (2011)
37		Xrysovalantis Kavousianos, Krishnendu Chakrabarty: Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects. IEEE Trans. on CAD of Integrated Circuits and Systems 30(5): 787-791 (2011)
	2010
36		Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Emmanouil Kalligeros, Vasileios Tenentes: Defect Coverage-Driven Window-Based Test Compression. Asian Test Symposium 2010: 141-146
35		S. Balatsouka, Vasileios Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty: Defect aware X-filling for low-power scan testing. DATE 2010: 873-878
34		Vasileios Tenentes, Xrysovalantis Kavousianos: Self-Freeze Linear Decompressors for Low Power Testing. ISVLSI 2010: 63-68
33		Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros: Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores. IEEE Trans. on CAD of Integrated Circuits and Systems 29(10): 1640-1644 (2010)
	2009
32		Xrysovalantis Kavousianos, Krishnendu Chakrabarty: Generation of compact test sets with high defect coverage. DATE 2009: 1130-1135
31		M. Koutsoupia, Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: LFSR-based test-data compression with self-stoppable seeds. DATE 2009: 1482-1487
30		Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: Efficient partial scan cell gating for low-power scan-based testing. ACM Trans. Design Autom. Electr. Syst. 14(2): (2009)
	2008
29		Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros: State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores. DATE 2008: 474-479
28		Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains. IEEE Trans. VLSI Syst. 16(7): 926-931 (2008)
27		Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1333-1338 (2008)
	2007
26		Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Optimal Selective Huffman Coding for Test-Data Compression. IEEE Trans. Computers 56(8): 1146-1152 (2007)
25		Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores. IEEE Trans. on CAD of Integrated Circuits and Systems 26(6): 1070-1083 (2007)
	2006
24		Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Efficient test-data compression for IP cores using multilevel Huffman coding. DATE 2006: 1033-1038
23		Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: Efficient Multiphase Test Set Embedding for Scan-based Testing. ISQED 2006: 433-438
	2005
22		Emmanouil Kalligeros, D. Kaseridis, Xrysovalantis Kavousianos, Dimitris Nikolos: Reseeding-Based Test Set Embedding with Reduced Test Sequences. ISQED 2005: 226-231
	2004
21		Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos, Xrysovalantis Kavousianos: Low Power Testing by Test Vector Ordering with Vector Repetition. ISQED 2004: 205-210
20		Xrysovalantis Kavousianos, Dimitris Bakalis, Maciej Bellos, Dimitris Nikolos: An Efficient Test Vector Ordering Method for Low Power Testing. ISVLSI 2004: 285-288
19		Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: Multiphase BIST: a new reseeding technique for high test-data compression. IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1429-1446 (2004)
	2003
18		Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: A highly regular multi-phase reseeding technique for scan-based BIST. ACM Great Lakes Symposium on VLSI 2003: 295-298
17		Giorgos Dimitrakopoulos, Xrysovalantis Kavousianos, Dimitris Nikolos: Virtual-scan: a novel approach for software-based self-testing of microprocessors. ISCAS (5) 2003: 237-240
16		Maciej Bellos, Xrysovalantis Kavousianos, Dimitris Nikolos, Dimitri Kagaris: DV-TSE: Difference Vector Based Test Set Embedding. VLSI-SOC 2003: 343-
	2002
15		Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: A ROMless LFSR Reseeding Scheme for Scan-based BIST. Asian Test Symposium 2002: 206-
14		Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: An Efficient Seeds Selection Method for LFSR-Based Test-per-Clock BIST. ISQED 2002: 261-266
13		Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos, Spyros Tragoudas: A new built-in TPG method for circuits with random patternresistant faults. IEEE Trans. on CAD of Integrated Circuits and Systems 21(7): 859-866 (2002)
12		Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST. J. Electronic Testing 18(3): 315-332 (2002)
	2001
11		Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: A novel reseeding technique for accumulator-based test pattern generation. ACM Great Lakes Symposium on VLSI 2001: 7-12
10		Stanislaw J. Piestrak, Dimitris Bakalis, Xrysovalantis Kavousianos: On the Design of Self-Testing Checkers for Modified Berger Codes. IOLTW 2001: 153-157
9		Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: A New Reseeding Technique for LFSR-Based Test Pattern Generation. IOLTW 2001: 80-86
8		Dimitris Bakalis, Dimitris Nikolos, Haridimos T. Vergos, Xrysovalantis Kavousianos: On Accumulator-Based Bit-Serial Test Response Compaction Schemes. ISQED 2001: 350-
	2000
7		Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: Test response compaction by an accumulator behaving as a multiple input non-linear feedback shift register. ITC 2000: 804-811
	1999
6		Xrysovalantis Kavousianos, Dimitris Bakalis, Haridimos T. Vergos, Dimitris Nikolos, George Alexiou: Low Power Dissipation in BIST Schemes for Modified Booth Multipliers. DFT 1999: 121-129
5		Xrysovalantis Kavousianos, Dimitris Nikolos: Modular TSC Checkers for Bose-Lin and Bose Codes. VTS 1999: 354-360
4		Xrysovalantis Kavousianos, Dimitris Nikolos, G. Foukarakis, T. Gnardellis: New efficient totally self-checking Berger code checkers. Integration 28(1): 101-118 (1999)
	1998
3		Xrysovalantis Kavousianos, Dimitris Nikolos: Novel Single and Double Output TSC Berger Code Checkers. VTS 1998: 348-353
	1997
2		Xrysovalantis Kavousianos, Dimitris Nikolos, G. Sidiropoulos: Design of Compact and High speed, Totally Self Checking CMOS Checkers for m-out-of-n Codes. DFT 1997: 128-136
1		Xrysovalantis Kavousianos, Dimitris Nikolos: Self-exercising self testing k-order comparators. VTS 1997: 216-221

Coauthor Index

1	George Alexiou (G. Ph. Alexiou)	[6]
2	Dimitris Bakalis	[6] [7] [8] [9] [10] [11] [12] [13] [14] [20] [21] [30]
3	S. Balatsouka	[35]
4	Maciej Bellos	[16] [20] [21]
5	Krishnendu Chakrabarty	[32] [35] [36] [37] [38] [39] [40] [42] [44]
6	Giorgos Dimitrakopoulos	[17]
7	G. Foukarakis	[4]
8	T. Gnardellis	[4]
9	Arvind Jain	[44]
10	Dimitrios Kagaris (Dimitri Kagaris)	[16]
11	Emmanouil Kalligeros	[9] [12] [14] [15] [18] [19] [22] [23] [24] [25] [26] [27] [28] [29] [31] [33] [36] [38]
12	D. Kaseridis	[22]
13	M. Koutsoupia	[31]
14	Yan Luo	[42]
15	Dimitris Nikolos	[1] [2] [3] [4] [5] [6] [7] [8] [9] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [30] [31]
16	Rubin A. Parekhji	[44]
17	Stanislaw J. Piestrak	[10]
18	G. Sidiropoulos	[2]
19	Vasileios Tenentes	[29] [33] [34] [35] [36] [38] [41] [43]
20	Spyros Tragoudas	[13]
21	Yiorgos Tsiatouhas (Y. Tsiatouhas)	[39] [40] [42]
22	Haridimos T. Vergos	[6] [8]
23	Zhaobo Zhang	[39] [40] [42]

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