![]() | ![]() |
| 2008 | ||
|---|---|---|
| 2 | Kan Takeuchi, Genichi Tanaka, Hiroaki Matsushita, Kenichi Yoshizumi, Yusaku Katsuki, Takao Sato: Observations of Supply-Voltage-Noise Dispersion in Sub-nsec. ITC 2008: 1-8 | |
| 1 | Kan Takeuchi, A. Yoshikawa, M. Komoda, K. Kotani, Hiroaki Matsushita, Yusaku Katsuki, Y. Yamamoto, Takao Sato: Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. IEEE Trans. VLSI Syst. 16(11): 1559-1566 (2008) | |
| 1 | M. Komoda | [1] |
| 2 | K. Kotani | [1] |
| 3 | Hiroaki Matsushita | [1] [2] |
| 4 | Takao Sato | [1] [2] |
| 5 | Kan Takeuchi | [1] [2] |
| 6 | Genichi Tanaka | [2] |
| 7 | Y. Yamamoto | [1] |
| 8 | A. Yoshikawa | [1] |
| 9 | Kenichi Yoshizumi | [2] |
Data released under the ODC-BY 1.0 license — See also our legal information page