Nobuyuki Kasuga

	1990
2		Jun Kurita, Nobuyuki Kasuga, Kiyoyasu Hiwada: An advanced test system architecture for synchronous and asynchronous control of mixed signal device testing. ITC 1990: 508-513
	1989
1		Kohei Akiyama, Hiroshi Nishimura, Kyoji Anazawa, Akito Kishida, Nobuyuki Kasuga: High-Resolution Analog Measurement on Mixed-Signal LSI Tester. ITC 1989: 124-128

Coauthor Index

1	Kohei Akiyama	[1]
2	Kyoji Anazawa	[1]
3	Kiyoyasu Hiwada	[2]
4	Akito Kishida	[1]
5	Jun Kurita	[2]
6	Hiroshi Nishimura	[1]

Colors in the list of coauthors

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