Dominik Kasprowicz

	2009
4		Marcus Weis, Andrzej Pfitzner, Dominik Kasprowicz, Rainer Emling, Wojciech Maly, Doris Schmitt-Landsiedel: Adder Circuits with Transistors using Independently Controlled Gates. ISCAS 2009: 449-452
	2008
3		Yi-Wei Lin, Malgorzata Marek-Sadowska, Wojciech Maly, Andrzej Pfitzner, Dominik Kasprowicz: Is there always performance overhead for regular fabric? ICCD 2008: 557-562
	2003
2		Dominik Kasprowicz, Witold A. Pleskacz: Improvement of integrated circuit testing reliability by using the defect based approach. Microelectronics Reliability 43(6): 945-953 (2003)
	2001
1		Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz: CMOS Standard Cells Characterization for Defect Based Testing. DFT 2001: 384-

Coauthor Index

1	Rainer Emling	[4]
2	Wieslaw Kuzmicz	[1]
3	Yi-Wei Lin	[3]
4	Wojciech Maly	[3] [4]
5	Malgorzata Marek-Sadowska	[3]
6	Tomasz Oleszczak	[1]
7	Andrzej Pfitzner	[3] [4]
8	Witold A. Pleskacz	[1] [2]
9	Doris Schmitt-Landsiedel	[4]
10	Marcus Weis	[4]

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