Norihide Kashio

	2009
2		Yoshino K. Fukai, Kenji Kurishima, Norihide Kashio, Minoru Ida, Shoji Yamahata, Takatomo Enoki: Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal. Microelectronics Reliability 49(4): 357-364 (2009)
	2008
1		Norihide Kashio, Kenji Kurishima, Yoshino K. Fukai, Shoji Yamahata: Highly Reliable Submicron InP-Based HBTs with over 300-GHz ft. IEICE Transactions 91-C(7): 1084-1090 (2008)

Coauthor Index

1	Takatomo Enoki	[2]
2	Yoshino K. Fukai	[1] [2]
3	Minoru Ida	[2]
4	Kenji Kurishima	[1] [2]
5	Shoji Yamahata	[1] [2]

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