 | 2011 |
|---|
| 6 |       | Cathy Kardach,
I. Kapilevich,
J. Block,
Ted Lundquist,
Steven Kasapi,
J. Liao,
Yin S. Ng,
Bruce Cory:
Foundry workflow for dynamic-EFA-based yield ramp.
Microelectronics Reliability 51(9-11): 1668-1672 (2011) |
| 2010 |
|---|
| 5 | | Joy Y. Liao,
Steven Kasapi,
Bruce Cory,
Howard L. Marks,
Yin S. Ng:
Scan chain failure analysis using laser voltage imaging.
Microelectronics Reliability 50(9-11): 1422-1426 (2010) |
| 2009 |
|---|
| 4 | | Joy Y. Liao,
Tung Ton,
Nathan Slattengren,
Steven Kasapi,
William K. Lo,
Howard L. Marks,
Yin S. Ng,
Ted Lundquist:
Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing.
Microelectronics Reliability 49(9-11): 1127-1131 (2009) |
| 2008 |
|---|
| 3 | | Ulrike Kindereit,
Christian Boit,
Uwe Kerst,
Steven Kasapi,
Radu Ispasoiu,
Roy Ng,
William K. Lo:
Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology.
Microelectronics Reliability 48(8-9): 1322-1326 (2008) |
| 2006 |
|---|
| 2 | | Radu Ispasoiu,
Tom Crawford,
Brian Johnston,
Chris Shaw,
Steven Kasapi,
Jason Goertz,
Olivier Rinaudo,
Peter Ouimet:
Reduction of the acquisition time for CMOS time-resolved photon emission by optimized IR detection.
Microelectronics Reliability 46(9-11): 1504-1507 (2006) |
| 2001 |
|---|
| 1 | | G. Dajee,
N. Goldblatt,
Ted Lundquist,
Steven Kasapi,
Keneth R. Wilsher:
Practical, non-invasive optical probing for flip-chip devices.
ITC 2001: 433-442 |
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