Eric Karl

	2012
11		Eric Karl, Yih Wang, Yong-Gee Ng, Zheng Guo, Fatih Hamzaoglu, Uddalak Bhattacharya, Kevin Zhang, Kaizad Mistry, Mark Bohr: A 4.6GHz 162Mb SRAM design in 22nm tri-gate CMOS technology with integrated active VMIN-enhancing assist circuitry. ISSCC 2012: 230-232
	2011
10		Prashant Singh, Eric Karl, Dennis Sylvester, David Blaauw: Dynamic NBTI Management Using a 45 nm Multi-Degradation Sensor. IEEE Trans. on Circuits and Systems 58-I(9): 2026-2037 (2011)
9		Pramod Kolar, Eric Karl, Uddalak Bhattacharya, Fatih Hamzaoglu, Henry Nho, Yong-Gee Ng, Yih Wang, Kevin Zhang: A 32 nm High-k Metal Gate SRAM With Adaptive Dynamic Stability Enhancement for Low-Voltage Operation. J. Solid-State Circuits 46(1): 76-84 (2011)
	2010
8		Prashant Singh, Eric Karl, Dennis Sylvester, David Blaauw: Dynamic NBTI management using a 45nm multi-degradation sensor. CICC 2010: 1-4
7		Hyunwoo Nho, Pramod Kolar, Fatih Hamzaoglu, Yih Wang, Eric Karl, Yong-Gee Ng, Uddalak Bhattacharya, Kevin Zhang: A 32nm High-k metal gate SRAM with adaptive dynamic stability enhancement for low-voltage operation. ISSCC 2010: 346-347
	2009
6		Prashant Singh, Cheng Zhuo, Eric Karl, David Blaauw, Dennis Sylvester: Sensor-Driven Reliability and Wearout Management. IEEE Design & Test of Computers 26(6): 40-49 (2009)
	2008
5		Eric Karl, Dennis Sylvester, David Blaauw: Analysis of System-Level Reliability Factors and Implications on Real-Time Monitoring Methods for Oxide Breakdown Device Failures. ISQED 2008: 391-395
4		Eric Karl, David Blaauw, Dennis Sylvester, Trevor N. Mudge: Multi-Mechanism Reliability Modeling and Management in Dynamic Systems. IEEE Trans. VLSI Syst. 16(4): 476-487 (2008)
	2006
3		Eric Karl, David Blaauw, Dennis Sylvester, Trevor N. Mudge: Reliability modeling and management in dynamic microprocessor-based systems. DAC 2006: 1057-1060
2		Dennis Sylvester, David Blaauw, Eric Karl: ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon. IEEE Design & Test of Computers 23(6): 484-490 (2006)
	2005
1		Eric Karl, Dennis Sylvester, David Blaauw: Timing error correction techniques for voltage-scalable on-chip memories. ISCAS (4) 2005: 3563-3566

Coauthor Index

1	Uddalak Bhattacharya	[7] [9] [11]
2	David Blaauw (David T. Blaauw)	[1] [2] [3] [4] [5] [6] [8] [10]
3	Mark Bohr	[11]
4	Zheng Guo	[11]
5	Fatih Hamzaoglu	[7] [9] [11]
6	Pramod Kolar	[7] [9]
7	Kaizad Mistry	[11]
8	Trevor N. Mudge	[3] [4]
9	Yong-Gee Ng	[7] [9] [11]
10	Henry Nho	[9]
11	Hyunwoo Nho	[7]
12	Prashant Singh	[6] [8] [10]
13	Dennis Sylvester	[1] [2] [3] [4] [5] [6] [8] [10]
14	Yih Wang	[7] [9] [11]
15	Kevin Zhang	[7] [9] [11]
16	Cheng Zhuo	[6]

Colors in the list of coauthors

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