Naghmeh Karimi

	2012
14		Naghmeh Karimi, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil: Test generation for clock-domain crossing faults in integrated circuits. DATE 2012: 406-411
	2011
13		Naghmeh Karimi, Zhiqiu Kong, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil: Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip. Asian Test Symposium 2011: 7-14
12		Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris: Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller. IEEE Trans. Computers 60(9): 1260-1273 (2011)
11		Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Chandra Tirumurti, Yiorgos Makris: Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor. IEEE Trans. Computers 60(9): 1274-1287 (2011)
	2009
10		Naghmeh Karimi, Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris: Impact analysis of performance faults in modern microprocessors. ICCD 2009: 91-96
9		Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris: Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller. VTS 2009: 9-14
	2008
8		Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris, Abhijit Jas, Chandra Tirumurti: Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller. DFT 2008: 454-462
7		Armin Alaghi, Mahshid Sedghi, Naghmeh Karimi, Mahmood Fathy, Zainalabedin Navabi: Reliable NoC architecture utilizing a robust rerouting algorithm. EWDTS 2008: 200-203
6		Naghmeh Karimi, Soheil Aminzadeh, Saeed Safari, Zainalabedin Navabi: A Novel GA-Based High-Level Synthesis Technique to Enhance RT-Level Concurrent Testing. IOLTS 2008: 173-174
5		Armin Alaghi, Mahshid Sedghi, Naghmeh Karimi, Zainalabedin Navabi: NoC Reconfiguration for Utilizing the Largest Fault-free Connected Sub-structure. ITC 2008: 1
4		Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Yiorgos Makris: On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. ITC 2008: 1-10
3		Naghmeh Karimi, Armin Alaghi, Mahshid Sedghi, Zainalabedin Navabi: Online Network-on-Chip Switch Fault Detection and Diagnosis Using Functional Switch Faults. J. UCS 14(22): 3716-3736 (2008)
	2007
2		Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi, Fabrizio Lombardi: RT level reliability enhancement by constructing dynamic TMRS. ACM Great Lakes Symposium on VLSI 2007: 172-175
1		Armin Alaghi, Naghmeh Karimi, Mahshid Sedghi, Zainalabedin Navabi: Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Mode. DFT 2007: 21-30

Coauthor Index

1	Armin Alaghi	[1] [3] [5] [7]
2	Soheil Aminzadeh	[6]
3	Krishnendu Chakrabarty	[13] [14]
4	Mahmood Fathy	[7]
5	Pallav Gupta	[13] [14]
6	Abhijit Jas	[4] [8] [9] [10] [11] [12]
7	Zhiqiu Kong	[13]
8	Fabrizio Lombardi	[2]
9	Yiorgos Makris	[4] [8] [9] [10] [11] [12]
10	Michail Maniatakos	[4] [8] [9] [10] [11] [12]
11	Shahrzad Mirkhani	[2]
12	Zainalabedin Navabi	[1] [2] [3] [5] [6] [7]
13	Srinivas Patil	[13] [14]
14	Saeed Safari	[6]
15	Mahshid Sedghi	[1] [3] [5] [7]
16	Chandra Tirumurti	[8] [9] [10] [11] [12]

Colors in the list of coauthors

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