Farzin Karimi

	2004
10		Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi: Using data compression in automatic test equipment for system-on-chip testing. IEEE T. Instrumentation and Measurement 53(2): 308-317 (2004)
	2003
9		Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi: Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936
8		Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi: Parallel testing of multi-port static random access memories. Microelectronics Journal 34(1): 3-21 (2003)
	2002
7		Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi: Data Compression for System-on-Chip Testing Using ATE. DFT 2002: 166-176
6		Farzin Karimi, Fabrizio Lombardi: A Scan-Bist Environment for Testing Embedded Memories. IOLTW 2002: 211-
5		Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi: Random Testing of Multi-Port Static Random Access Memories. MTDT 2002: 101-108
4		Farzin Karimi, Fabrizio Lombardi: A Scan-Bist Environment for Testing Embedded Memories. MTDT 2002: 17-
	2001
3		Farzin Karimi, Fabrizio Lombardi: Parallel Testing of Multi-port Static Random Access Memories for BIST. DFT 2001: 271-279
2		Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby: A Parallel Approach for Testing Multi-Port Static Random Access Memories. MTDT 2001: 73-
1		Wenyi Feng, Farzin Karimi, Fabrizio Lombardi: Fault Detection in a Tristate System Environment. IEEE Micro 21(5): 77-85 (2001)

Coauthor Index

1	T. Crosby	[2] [8]
2	Wenyi Feng	[1]
3	Hamidreza Hashempour	[9]
4	V. Swamy Irrinki	[2] [8]
5	Fabrizio Lombardi	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10]
6	Waleed Meleis	[7] [10]
7	Fred J. Meyer	[5] [9]
8	Zainalabedin Navabi	[7] [10]
9	Nohpill Park	[8]

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