H. Karbasi

	2005
1		Maxim Ershov, Sharad Saxena, Sean Minehane, P. Clifton, Mark Redford, R. Lindley, H. Karbasi, S. Graves, S. Winters: Degradation dynamics, recovery, and characterization of negative bias temperature instability. Microelectronics Reliability 45(1): 99-105 (2005)

Coauthor Index

1	P. Clifton	[1]
2	Maxim Ershov	[1]
3	S. Graves	[1]
4	R. Lindley	[1]
5	Sean Minehane	[1]
6	Mark Redford	[1]
7	Sharad Saxena	[1]
8	S. Winters	[1]

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