Rohit Kapur

	2012
59		Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur: A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection. VLSI Design 2012: 436-441
	2011
58		Jyotirmoy Saikia, Pramod Notiyath, Santosh Kulkarni, Ashok Anbalan, Rajesh Uppuluri, Tammy Fernandes, Parthajit Bhattacharya, Rohit Kapur: Predicting Scan Compression IP Configurations for Better QoR. Asian Test Symposium 2011: 261-266
57		Anshuman Chandra, Jyotirmoy Saikia, Rohit Kapur: Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C). Asian Test Symposium 2011: 432-437
56		Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur: Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. VLSI Design 2011: 364-369
55		Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg: Special session 5B: Panel How much toggle activity should we be testing with? VTS 2011: 114
	2010
54		Rohit Kapur: Conference Reports. IEEE Design & Test of Computers 27(2): 75 (2010)
53		Rohit Kapur: Conference Reports. IEEE Design & Test of Computers 27(3): 75 (2010)
52		Rohit Kapur: Conference Reports. IEEE Design & Test of Computers 27(4): 77 (2010)
	2009
51		Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa: Scalable Adaptive Scan (SAS). DATE 2009: 1476-1481
50		Anshuman Chandra, Yasunari Kanzawa, Rohit Kapur: Proactive management of X's in scan chains for compression. ISQED 2009: 260-265
49		Rohit Kapur, Paul Reuter, Sandeep Bhatia, Brion L. Keller: CTL and Its Usage in the EDA Industry. IEEE Design & Test of Computers 26(1): 36-43 (2009)
	2008
48		Anshuman Chandra, Felix Ng, Rohit Kapur: Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction. DATE 2008: 462-467
47		Anshuman Chandra, Rohit Kapur: Interval Based X-Masking for Scan Compression Architectures. ISQED 2008: 821-826
46		Anshuman Chandra, Rohit Kapur: Bounded Adjacent Fill for Low Capture Power Scan Testing. VTS 2008: 131-138
45		Rohit Kapur, Subhasish Mitra, Thomas W. Williams: Historical Perspective on Scan Compression. IEEE Design & Test of Computers 25(2): 114-120 (2008)
	2007
44		Rajesh Galivanche, Rohit Kapur, Antonio Rubio: Testing in the year 2020. DATE 2007: 960-965
43		Maria Gkatziani, Rohit Kapur, Qing Su, Ben Mathew, Roberto Mattiuzzo, Laura Tarantini, Cy Hay, Salvatore Talluto, Thomas W. Williams: Accurately Determining Bridging Defects from Layout. DDECS 2007: 87-90
42		Rohit Kapur, Jindrich Zejda, Thomas W. Williams: Fundamentals of timing information for test: How simple can we get? ITC 2007: 1-7
41		Peter Wohl, John A. Waicukauski, Rohit Kapur, Sanjay Ramnath, Emil Gizdarski, Thomas W. Williams, P. Jaini: Minimizing the Impact of Scan Compression. VTS 2007: 67-74
40		Anshuman Chandra, Haihua Yan, Rohit Kapur: Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction. VTS 2007: 84-92
39		Rohit Kapur, T. Finklea, Felix Ng, Anshuman Chandra, Sanjay Ramnath, Peter Wohl, Thomas W. Williams, Ashok Anbalan, Sandeep S. Kulkarni, Tammy Fernandes, Pramod Notiyath, Rajesh Uppuluri: DFT MAX and Power. J. Low Power Electronics 3(2): 199-205 (2007)
	2006
38		Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie: OCI: Open Compression Interface. ITC 2006: 1-4
	2005
37		Rohit Kapur: Test the test experts: do we know what we are doing? ITC 2005: 1
36		Peter Wohl, John A. Waicukauski, Sanjay Patel, Francisco DaSilva, Thomas W. Williams, Rohit Kapur: Efficient compression of deterministic patterns into multiple PRPG seeds. ITC 2005: 10
	2004
35		Rohit Kapur: Security vs. Test Quality: Are they mutually exclusive?. ITC 2004: 1414
34		Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Frederic Neuveux, Thomas W. Williams: Changing the Scan Enable during Shift. VTS 2004: 73-78
	2003
33		Nahmsuk Oh, Rohit Kapur, Thomas W. Williams, Jim Sproch: Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture. DATE 2003: 10110-10115
32		Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur: Overview of the IEEE P1500 Standard. ITC 2003: 988-997
31		Samitha Samaranayake, Emil Gizdarski, Nodari Sitchinava, Frederic Neuveux, Rohit Kapur, Thomas W. Williams: A Reconfigurable Shared Scan-in Architecture. VTS 2003: 9-14
30		Bruce Cory, Rohit Kapur, Bill Underwood: Speed Binning with Path Delay Test in 150-nm Technology. IEEE Design & Test of Computers 20(5): 41-45 (2003)
	2002
29		Rohit Kapur, Thomas W. Williams: Manufacturing Test of SoCs. Asian Test Symposium 2002: 317-319
28		Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374
27		Rohit Kapur, Thomas W. Williams, M. Ray Mercer: Directed-Binary Search in Logic BIST Diagnostics. DATE 2002: 1121
26		Nahmsuk Oh, Rohit Kapur, Thomas W. Williams: Fast seed computation for reseeding shift register in test pattern compression. ICCAD 2002: 76-81
25		Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC 2002: 407-416
24		Loïs Guiller, Frederic Neuveux, S. Duggirala, R. Chandramouli, Rohit Kapur: Integrating DFT in the Physical Synthesis Flow. ITC 2002: 788-795
23		Samitha Samaranayake, Nodari Sitchinava, Rohit Kapur, Minesh B. Amin, Thomas W. Williams: Dynamic Scan: Driving Down the Cost of Test. IEEE Computer 35(10): 63-68 (2002)
22		Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian: On IEEE P1500's Standard for Embedded Core Test. J. Electronic Testing 18(4-5): 365-383 (2002)
	2001
21		Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay: CTL the language for describing core-based test. ITC 2001: 131-139
20		Rohit Kapur, Thomas W. Williams: Tester retargetable patterns. ITC 2001: 721-727
19		Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir: A new methodology for improved tester utilization. ITC 2001: 916-923
18		Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti: IP and Automation to Support IEEE P1500. VTS 2001: 411-412
17		Rohit Kapur, R. Chandramouli, Thomas W. Williams: Strategies for Low-Cost Test. IEEE Design & Test of Computers 18(6): 47-54 (2001)
	2000
16		F. Hayat, Thomas W. Williams, Rohit Kapur, D. Hsu: DFT closure. Asian Test Symposium 2000: 8-9
15		Thomas W. Williams, Rohit Kapur: Design for Testability in Nanometer Technologies; Searching for Quality. ISQED 2000: 167-172
14		Yervant Zorian, Erik Jan Marinissen, Rohit Kapur: On using IEEE P1500 SECT for test plug-n-play. ITC 2000: 770-777
13		Rohit Kapur, Cy Hay, Thomas W. Williams: The Mutating Metric for Benchmarking Test. IEEE Design & Test of Computers 17(3): 18-21 (2000)
	1999
12		Rohit Kapur: High level ATPG is important and is on its way! ITC 1999: 1115-1116
11		Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel: Towards a standard for embedded core test: an example. ITC 1999: 616-627
10		Rohit Kapur, Thomas W. Williams: Tough Challenges as Design and Test Go Nanometer - Guest Editors' Introduction. IEEE Computer 32(11): 42-45 (1999)
	1997
9		Magdy S. Abadir, Rohit Kapur: Cost-Driven Ranking of Memory Elements for Partial Intrusion. IEEE Design & Test of Computers 14(3): 45-50 (1997)
	1996
8		Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly: IDDQ Test: Sensitivity Analysis of Scaling. ITC 1996: 786-792
7		Rohit Kapur, Edward F. Miller: System Test and Reliability: Techniques for Avoiding Failure (Guest Editors' Introduction). IEEE Computer 29(11): 28-30 (1996)
6		Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: A weighted random pattern test generation system. IEEE Trans. on CAD of Integrated Circuits and Systems 15(8): 1020-1025 (1996)
	1994
5		Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: Design of an Efficient Weighted-Random-Pattern Generation System. ITC 1994: 491-500
	1992
4		M. Ray Mercer, Rohit Kapur, Don E. Ross: Functional Approaches to Generating Orderings for Efficient Symbolic Representations. DAC 1992: 624-627
3		Rohit Kapur, Jaehong Park, M. Ray Mercer: All Tests for a Fault Are Not Equally Valuable for Defect Detection. ITC 1992: 762-769
2		Rohit Kapur, M. Ray Mercer: Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes. IEEE Trans. Computers 41(12): 1580-1588 (1992)
	1991
1		Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer: Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC 1991: 417-420

Coauthor Index

1	Magdy S. Abadir	[9]
2	Minesh B. Amin	[23]
3	Ashok Anbalan	[39] [58]
4	Karim Arabi	[32]
5	David Armstrong	[19]
6	Anand Bhat	[55]
7	Sandeep Bhatia	[49]
8	Parthajit Bhattacharya	[58]
9	Dwayne Burek	[18] [38]
10	Kenneth M. Butler	[1]
11	Anshuman Chandra	[39] [40] [46] [47] [48] [50] [51] [57]
12	R. Chandramouli	[17] [24]
13	Santanu Chattopadhyay	[56] [59]
14	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[25] [28]
15	Bruce Cory	[30] [38]
16	Francisco DaSilva	[32] [36]
17	Garen Darbinyan	[18]
18	Robert H. Dennard	[8]
19	S. Duggirala	[24]
20	Jennifer Dworak	[25] [28]
21	Tammy Fernandes	[39] [58]
22	T. Finklea	[39]
23	Rajesh Galivanche	[44]
24	Emil Gizdarski	[31] [34] [41]
25	Maria Gkatziani	[43]
26	Loïs Guiller	[24]
27	Cy Hay	[13] [43]
28	F. Hayat	[16]
29	D. Hsu	[16]
30	P. Jaini	[41]
31	Yasunari Kanzawa	[50] [51]
32	Mark Kassab	[38]
33	Douglas Kay	[21]
34	Brion L. Keller	[21] [38] [49]
35	Ajay Khoche	[19]
36	Kee Sup Kim	[38]
37	Sandeep S. Kulkarni	[39]
38	Santosh Kulkarni	[58]
39	Subhadip Kundu	[56] [59]
40	Jing-Jia Liou	[25] [28]
41	Maurice Lousberg	[18] [21] [22]
42	Amitava Majumdar	[55]
43	Wojciech Maly	[8]
44	Erik Jan Marinissen	[11] [14] [22]
45	Ben Mathew	[43]
46	Roberto Mattiuzzo	[43]
47	Teresa L. McLaurin	[18] [22]
48	M. Ray Mercer	[1] [2] [3] [4] [8] [25] [27] [28]
49	Edward F. Miller	[7]
50	Subhasish Mitra	[45]
51	Benoit Nadeau-Dostie	[38]
52	Frederic Neuveux	[24] [31] [34]
53	Felix Ng	[39] [48]
54	Pramod Notiyath	[39] [58]
55	Steven F. Oakland	[38]
56	Nahmsuk Oh	[26] [33]
57	Jaehong Park	[3]
58	Sanjay Patel	[36]
59	Srinivas Patil	[5] [6]
60	Sanjay Ramnath	[39] [41]
61	Paul Reuter	[21] [49]
62	Mike Ricchetti	[18] [22]
63	Jochen Rivoir	[19]
64	Don E. Ross	[1] [4]
65	Antonio Rubio	[44]
66	Jyotirmoy Saikia	[57] [58]
67	Samitha Samaranayake	[23] [31] [34]
68	Indranil Sengupta	[56] [59]
69	Nodari Sitchinava	[23] [31] [34]
70	Thomas J. Snethen	[5] [6]
71	Jim Sproch	[33]
72	Qing Su	[43]
73	Salvatore Talluto	[43]
74	Laura Tarantini	[43]
75	Tony Taylor	[11] [21]
76	Mick Tegethoff	[19] [38]
77	Mohammad Tehranipoor	[55]
78	Bill Underwood	[30]
79	Rajesh Uppuluri	[39] [58]
80	John A. Waicukauski	[36] [41]
81	Li-C. Wang	[25] [28]
82	Xiaoqing Wen	[55]
83	Lee Whetsel	[11] [32]
84	Thomas W. Williams	[5] [6] [8] [10] [13] [15] [16] [17] [19] [20] [23] [25] [26] [27] [28] [29] [31] [33] [34] [36] [39] [41] [42] [43] [45]
85	LeRoy Winemberg	[55]
86	Peter Wohl	[36] [39] [41]
87	Haihua Yan	[40]
88	Jindrich Zejda	[42]
89	Yervant Zorian	[11] [14] [22] [32]

Colors in the list of coauthors

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