Scott L. Kaplin

	1988
1		Scott L. Kaplin, George D. Hadden, Lina Volovik, Rick Swanson: A General Architecture for Factory-based Diagnosis of Electronics. IEA/AIE (Vol. 1) 1988: 100-108

Coauthor Index

1	George D. Hadden	[1]
2	Rick Swanson	[1]
3	Lina Volovik	[1]

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