 | 2010 |
| 20 |  | Kunhyuk Kang,
Sang Phill Park,
Keejong Kim,
Kaushik Roy:
On-Chip Variability Sensor Using Phase-Locked Loop for Detecting and Correcting Parametric Timing Failures.
IEEE Trans. VLSI Syst. 18(2): 270-280 (2010) |
| 19 |  | Seung Hoon Choi,
Kunhyuk Kang,
Florentin Dartu,
Kaushik Roy:
Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching.
IEEE Trans. on CAD of Integrated Circuits and Systems 29(3): 497-502 (2010) |
| 2009 |
| 18 |  | Sang Phill Park,
Kunhyuk Kang,
Kaushik Roy:
Reliability Implications of Bias-Temperature Instability in Digital ICs.
IEEE Design & Test of Computers 26(6): 8-17 (2009) |
| 17 |  | Jing Li,
Kunhyuk Kang,
Kaushik Roy:
Variation Estimation and Compensation Technique in Scaled LTPS TFT Circuits for Low-Power Low-Cost Applications.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(1): 46-59 (2009) |
| 2008 |
| 16 |  | Kunhyuk Kang,
Saakshi Gangwal,
Sang Phill Park,
Kaushik Roy:
NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?
ASP-DAC 2008: 726-731 |
| 2007 |
| 15 |  | Jing Li,
Kunhyuk Kang,
Aditya Bansal,
Kaushik Roy:
High Performance and Low Power Electronics on Flexible Substrate.
DAC 2007: 274-275 |
| 14 |  | Kunhyuk Kang,
Keejong Kim,
Ahmad E. Islam,
Muhammad Ashraful Alam,
Kaushik Roy:
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement.
DAC 2007: 358-363 |
| 13 |  | Kunhyuk Kang,
Keejong Kim,
Kaushik Roy:
Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop.
DAC 2007: 934-939 |
| 12 |  | Kunhyuk Kang,
Sang Phill Park,
Kaushik Roy,
Muhammad Ashraful Alam:
Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance.
ICCAD 2007: 730-734 |
| 11 |  | Kunhyuk Kang,
Muhammad Ashraful Alam,
Kaushik Roy:
Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ.
ITC 2007: 1-10 |
| 10 |  | Amit Agarwal,
Kunhyuk Kang,
Swarup Bhunia,
James D. Gallagher,
Kaushik Roy:
Device-Aware Yield-Centric Dual-Vt Design Under Parameter Variations in Nanoscale Technologies.
IEEE Trans. VLSI Syst. 15(6): 660-671 (2007) |
| 9 |  | Kunhyuk Kang,
Haldun Kufluoglu,
Kaushik Roy,
Muhammad Ashraful Alam:
Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1770-1781 (2007) |
| 8 |  | Bipul Chandra Paul,
Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(4): 743-751 (2007) |
| 2006 |
| 7 |  | Bipul Chandra Paul,
Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits.
DATE 2006: 780-785 |
| 6 |  | Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI.
ICCD 2006 |
| 5 |  | Kunhyuk Kang,
Bipul C. Paul,
Kaushik Roy:
Statistical timing analysis using levelized covariance propagation considering systematic and random variations of process parameters.
ACM Trans. Design Autom. Electr. Syst. 11(4): 848-879 (2006) |
| 2005 |
| 4 |  | Kunhyuk Kang,
Bipul Chandra Paul,
Kaushik Roy:
Statistical Timing Analysis using Levelized Covariance Propagation.
DATE 2005: 764-769 |
| 3 |  | Amit Agarwal,
Kunhyuk Kang,
Kaushik Roy:
Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations.
ICCAD 2005: 736-741 |
| 2 |  | Amit Agarwal,
Kunhyuk Kang,
Swarup Bhunia,
James D. Gallagher,
Kaushik Roy:
Effectiveness of low power dual-Vt designs in nano-scale technologies under process parameter variations.
ISLPED 2005: 14-19 |
| 1 |  | Saibal Mukhopadhyay,
Kunhyuk Kang,
Hamid Mahmoodi,
Kaushik Roy:
Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring.
ITC 2005: 10 |