E. Y. Kang

	2005
1		Y. J. Song, H. J. Joo, S. K. Kang, H. H. Kim, J. H. Park, Y. M. Kang, E. Y. Kang, S. Y. Lee, K. Kim: Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology. Microelectronics Reliability 45(7-8): 1150-1153 (2005)

Coauthor Index

1	H. J. Joo	[1]
2	S. K. Kang	[1]
3	Y. M. Kang	[1]
4	H. H. Kim	[1]
5	K. Kim	[1]
6	S. Y. Lee	[1]
7	J. H. Park	[1]
8	Y. J. Song	[1]

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