Setsuo Kaneko

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2008

1 Kenichi Takatori, Hideki Asada, Setsuo Kaneko: Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT. IEICE Transactions 91-C(10): 1564-1569 (2008)

	2008
1		Kenichi Takatori, Hideki Asada, Setsuo Kaneko: Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT. IEICE Transactions 91-C(10): 1564-1569 (2008)

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