Toshinobu Kanai

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1996

1 Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima: Scan Design Oriented Test Technique for VLSI's Using ATE. ITC 1996: 453-460

	1996
1		Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima: Scan Design Oriented Test Technique for VLSI's Using ATE. ITC 1996: 453-460

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