Jean-Baptiste Kammerer

	2009
2		Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Modelling of hot-carrier degradation and its application for analog design for reliability. Microelectronics Journal 40(9): 1274-1280 (2009)
	2007
1		Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58

Coauthor Index

1	Francis Braun	[1] [2]
2	Benoit Dubois	[1] [2]
3	Luc Hebrard	[1] [2]

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