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| 2010 | ||
|---|---|---|
| 1 | Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra: QED: Quick Error Detection tests for effective post-silicon validation. ITC 2010: 154-163 | |
| 1 | Donald S. Gardner | [1] |
| 2 | Nagib Hakim | [1] |
| 3 | Ted Hong | [1] |
| 4 | Yanjing Li | [1] |
| 5 | David Lin | [1] |
| 6 | Subhasish Mitra | [1] |
| 7 | Diana Mui | [1] |
| 8 | Helia Naeimi | [1] |
| 9 | Sung-Boem Park | [1] |
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