Kuniyuki Kakushima

	2012
14		C. Dou, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, A. Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai: Resistive switching behavior of a CeO2 based ReRAM cell incorporated with Si buffer layer. Microelectronics Reliability 52(4): 688-691 (2012)
	2011
13		D. Zade, Soshi Sato, Kuniyuki Kakushima, A. Srivastava, Parhat Ahmet, Kazuo Tsutsui, A. Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Chandan Kumar Sarkar, Hiroshi Iwai: Effects of La2O3 incorporation in HfO2 gated nMOSFETs on low-frequency noise. Microelectronics Reliability 51(4): 746-750 (2011)
12		Soshi Sato, Kuniyuki Kakushima, Parhat Ahmet, Kenji Ohmori, Kenji Natori, Keisaku Yamada, Hiroshi Iwai: Structural advantages of rectangular-like channel cross-section on electrical characteristics of silicon nanowire field-effect transistors. Microelectronics Reliability 51(5): 879-884 (2011)
11		Kiichi Tachi, Sylvain Barraud, Kuniyuki Kakushima, Hiroshi Iwai, Sorin Cristoloveanu, Thomas Ernst: Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs. Microelectronics Reliability 51(5): 885-888 (2011)
10		Hiroshi Iwai, Kenji Natori, Kenji Shiraishi, Jun-ichi Iwata, Atsushi Oshiyama, Keisaku Yamada, Kenji Ohmori, Kuniyuki Kakushima, Parhat Ahmet: Si nanowire FET and its modeling. SCIENCE CHINA Information Sciences 54(5): 1004-1011 (2011)
	2010
9		Hiroshi Shimomura, Kuniyuki Kakushima, Hiroshi Iwai: Equivalent Noise Temperature Representation for Scaled MOSFETs. IEICE Transactions 93-C(10): 1550-1552 (2010)
8		Hiroshi Shimomura, Kuniyuki Kakushima, Hiroshi Iwai: Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 nm Node MOSFETs. IEICE Transactions 93-C(5): 678-684 (2010)
7		Yusuke Kobayashi, Kuniyuki Kakushima, Parhat Ahmet, V. Ramgopal Rao, Kazuo Tsutsui, Hiroshi Iwai: Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness. Microelectronics Reliability 50(3): 332-337 (2010)
6		Kuniyuki Kakushima, K. Okamoto, T. Koyanagi, M. Kouda, Kiichi Tachi, T. Kawanago, J. Song, Parhat Ahmet, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai: SrO capping effect for La2O3/Ce-silicate gate dielectrics. Microelectronics Reliability 50(3): 356-359 (2010)
5		Kuniyuki Kakushima, Kiichi Tachi, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai: Advantage of further scaling in gate dielectrics below 0.5 nm of equivalent oxide thickness with La2O3 gate dielectrics. Microelectronics Reliability 50(6): 790-793 (2010)
	2009
4		Sik-Lam Siu, Hei Wong, Wing-Shan Tam, Kuniyuki Kakushima, Hiroshi Iwai: Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors. Microelectronics Reliability 49(4): 387-391 (2009)
	2008
3		Parhat Ahmet, Kentaro Nakagawa, Kuniyuki Kakushima, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai: Electrical characteristics of MOSFETs with La2O3/Y2O3 gate stack. Microelectronics Reliability 48(11-12): 1769-1771 (2008)
	2007
2		Yusuke Kobayashi, C. Raghunathan Manoj, Kazuo Tsutsui, Venkanarayan Hariharan, Kuniyuki Kakushima, V. Ramgopal Rao, Parhat Ahmet, Hiroshi Iwai: Parasitic Effects in Multi-Gate MOSFETs. IEICE Transactions 90-C(10): 2051-2056 (2007)
	2005
1		Kuniyuki Kakushima, T. Bourouina, T. Sarnet, G. Kerrien, D. Débarre, J. Boulmer, Hiroyuki Fujita: Silicon periodic nano-structures obtained by laser exposure of nano-wires. Microelectronics Journal 36(7): 629-633 (2005)

Coauthor Index

1	Parhat Ahmet	[2] [3] [5] [6] [7] [10] [12] [13] [14]
2	Sylvain Barraud	[11]
3	J. Boulmer	[1]
4	T. Bourouina	[1]
5	Sorin Cristoloveanu	[11]
6	D. Débarre	[1]
7	C. Dou	[14]
8	Thomas Ernst	[11]
9	Hiroyuki Fujita	[1]
10	Venkanarayan Hariharan	[2]
11	Takeo Hattori	[3] [5] [6] [13] [14]
12	Hiroshi Iwai	[2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14]
13	Jun-ichi Iwata	[10]
14	T. Kawanago	[6]
15	G. Kerrien	[1]
16	Yusuke Kobayashi	[2] [7]
17	M. Kouda	[6]
18	T. Koyanagi	[6]
19	C. Raghunathan Manoj	[2]
20	Kentaro Nakagawa	[3]
21	Kenji Natori	[10] [12] [13] [14]
22	A. Nishiyama	[13] [14]
23	Hiroshi Nohira	[3] [6]
24	Kenji Ohmori	[10] [12]
25	K. Okamoto	[6]
26	Atsushi Oshiyama	[10]
27	V. Ramgopal Rao	[2] [7]
28	Chandan Kumar Sarkar	[13]
29	T. Sarnet	[1]
30	Soshi Sato	[12] [13]
31	Hiroshi Shimomura	[8] [9]
32	Kenji Shiraishi	[10]
33	Sik-Lam Siu	[4]
34	J. Song	[6]
35	A. Srivastava	[13]
36	Nobuyuki Sugii	[3] [5] [6] [13] [14]
37	Kiichi Tachi	[5] [6] [11]
38	Wing-Shan Tam	[4]
39	Kazuo Tsutsui	[2] [3] [5] [6] [7] [13] [14]
40	Hei Wong	[4]
41	Keisaku Yamada	[10] [12]
42	D. Zade	[13]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page