Y. Kakuhara

List of publications from the DBLP Bibliography Server - FAQ

Ask others: ACM DL/Guide -

2001

1 S. Yokogawa, N. Okada, Y. Kakuhara, H. Takizawa: Electromigration Performance of Multi-level Damascene Copper Interconnects. Microelectronics Reliability 41(9-10): 1409-1416 (2001)

	2001
1		S. Yokogawa, N. Okada, Y. Kakuhara, H. Takizawa: Electromigration Performance of Multi-level Damascene Copper Interconnects. Microelectronics Reliability 41(9-10): 1409-1416 (2001)

Coauthor Index

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team —

Data released under the ODC-BY 1.0 license — See also our legal information page