Ben Kaczer

	2011
13		Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jerome Mitard, Liesbeth Witters, Thomas Y. Hoffmann: Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. ISCAS 2011: 2249-2252
12		Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer, Brice De Jaeger: Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements. IEEE Trans. VLSI Syst. 19(9): 1569-1582 (2011)
	2010
11		Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer: Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits. ISCAS 2010: 1699-1702
	2009
10		R. Fernández-García, Ben Kaczer, Guido Groeseneken: A CMOS circuit for evaluating the NBTI over a wide frequency range. Microelectronics Reliability 49(8): 885-891 (2009)
	2008
9		Georges G. E. Gielen, Peter H. N. De Wit, Elie Maricau, J. Loeckx, J. Martín-Martínez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría: Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327
	2007
8		A. Shickova, Ben Kaczer, A. Veloso, M. Aoulaiche, M. Houssa, H. E. Maes, Guido Groeseneken, J. A. Kittl: NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase. Microelectronics Reliability 47(4-5): 505-507 (2007)
7		Ben Kaczer, Robin Degraeve, Philippe Roussel, Guido Groeseneken: Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability. Microelectronics Reliability 47(4-5): 559-566 (2007)
	2006
6		Antonis Papanikolaou, Miguel Miranda, Hua Wang, Francky Catthoor, M. Satyakiran, Pol Marchal, Ben Kaczer, C. Bruynseraede, Zsolt Tokei: Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. VLSI-SoC 2006: 342-347
5		R. Fernández, R. Rodríguez, M. Nafría, X. Aymerich, Ben Kaczer, Guido Groeseneken: FinFET and MOSFET preliminary comparison of gate oxide reliability. Microelectronics Reliability 46(9-11): 1608-1611 (2006)
	2005
4		Robert O'Connor, Greg Hughes, Robin Degraeve, Ben Kaczer: Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance. Microelectronics Reliability 45(5-6): 869-874 (2005)
	2003
3		Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003)
	2002
2		Ben Kaczer, Robin Degraeve, M. Rasras, A. De Keersgieter, K. Van de Mieroop, Guido Groeseneken: Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study. Microelectronics Reliability 42(4-5): 555-564 (2002)
1		Stefano Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002)

Coauthor Index

1	Massimo Alioto	[11] [12] [13]
2	E. Andries	[1]
3	M. Aoulaiche	[8]
4	Stefano Aresu	[1] [3]
5	X. Aymerich	[5]
6	C. Bruynseraede	[6]
7	Francky Catthoor	[6]
8	Ward De Ceuninck	[1] [3]
9	Miguel Corbalan (Miguel Miranda, Miguel Corbalan Miranda)	[6]
10	K. Croes	[1]
11	Felice Crupi	[11] [12] [13]
12	Jan D'Haen	[3]
13	Marc D'Olieslaeger	[1] [3]
14	Robin Degraeve	[1] [2] [3] [4] [7]
15	R. Dreesen	[1]
16	R. Fernández	[5]
17	R. Fernández-García	[10]
18	Jacopo Franco	[13]
19	Georges G. E. Gielen	[9]
20	Guido Groeseneken	[2] [5] [7] [8] [9] [10] [13]
21	Thomas Y. Hoffmann	[13]
22	M. Houssa	[8]
23	Greg Hughes	[4]
24	Brice De Jaeger	[12]
25	A. De Keersgieter	[2]
26	J. A. Kittl	[8]
27	G. Knuyt	[3]
28	J. Loeckx	[9]
29	H. E. Maes	[8]
30	Paolo Magnone	[11] [12] [13]
31	J. Manca	[1] [3]
32	Paul Marchal (Pol Marchal)	[6]
33	Elie Maricau	[9]
34	J. Martín-Martínez	[9]
35	J. Mertens	[3]
36	K. Van de Mieroop	[2]
37	Jerome Mitard	[13]
38	M. Nafría	[5] [9]
39	Robert O'Connor	[4]
40	Antonis Papanikolaou	[6]
41	M. Rasras	[2]
42	R. Rodríguez	[5] [9]
43	Philippe Roussel	[7]
44	M. Satyakiran	[6]
45	Luc De Schepper	[1] [3]
46	A. Shickova	[8]
47	Zsolt Tokei	[6]
48	A. Veloso	[8]
49	Hua Wang	[6]
50	Peter H. N. De Wit	[9]
51	Liesbeth Witters	[13]

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