A. Kabakow

	2005
2		Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted Lundquist, Siegfried Pauthner: Impact of back side circuit edit on active device performance in bulk silicon ICs. ITC 2005: 9
1		Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit: Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectronics Reliability 45(9-11): 1544-1549 (2005)

Coauthor Index

1	Christian Boit	[1]
2	Uwe Kerst	[1] [2]
3	Ted Lundquist	[2]
4	Siegfried Pauthner	[2]
5	Erwan Le Roy	[2]
6	Rudolf Schlangen	[1] [2]

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