Kees van Kaam

	2005
2		Kees van Kaam, Bart Vermeulen, Henk Jan Bergveld: Test and debug features of the RTO7 chip. ITC 2005: 10
	2001
1		Bram Kruseman, Rudger van Veen, Kees van Kaam: The future of delta I_DDQ testing. ITC 2001: 101-110

Coauthor Index

1	Henk Jan Bergveld	[2]
2	Bram Kruseman	[1]
3	Rudger van Veen	[1]
4	Bart Vermeulen	[2]

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