 | 2011 |
| 20 |  | Anton Tsertov,
Raimund Ubar,
Artur Jutman,
Sergei Devadze:
Automatic SoC Level Test Path Synthesis Based on Partial Functional Models.
Asian Test Symposium 2011: 532-538 |
| 19 |  | Anton Tsertov,
Raimund Ubar,
Artur Jutman,
Sergei Devadze:
SoC and Board Modeling for Processor-Centric Board Testing.
DSD 2011: 575-582 |
| 18 |  | Artur Jutman,
Sergei Devadze,
Igor Aleksejev:
Invited paper: System-wide fault management based on IEEE P1687 IJTAG.
ReCoSoC 2011: 1-4 |
| 2010 |
| 17 |  | Raimund Ubar,
Sergei Devadze,
Jaan Raik,
Artur Jutman:
Parallel X-fault simulation with critical path tracing technique.
DATE 2010: 879-884 |
| 16 |  | Raimund Ubar,
Sergei Devadze,
Jaan Raik,
Artur Jutman:
Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits.
DELTA 2010: 14-19 |
| 15 |  | Dmitri Mironov,
Raimund Ubar,
Sergei Devadze,
Jaan Raik,
Artur Jutman:
Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level Simulation of Digital Circuits.
DSD 2010: 658-663 |
| 14 |  | Anton Tsertov,
Artur Jutman,
Sergei Devadze:
Testing beyond the SoCs in a lego style.
EWDTS 2010: 334-338 |
| 13 |  | Raimund Ubar,
Dmitri Mironov,
Jaan Raik,
Artur Jutman:
Fault collapsing with linear complexity in digital circuits.
ISCAS 2010: 653-656 |
| 12 |  | Raimund Ubar,
Dmitri Mironov,
Jaan Raik,
Artur Jutman:
Structural fault collapsing by superposition of BDDs for test generation in digital circuits.
ISQED 2010: 250-257 |
| 2009 |
| 11 |  | Raimund Ubar,
Dmitri Mironov,
Jaan Raik,
Artur Jutman:
Structurally synthesized multiple input BDDs for simulation of digital circuits.
ICECS 2009: 451-454 |
| 10 |  | Sergei Devadze,
Artur Jutman,
Igor Aleksejev,
Raimund Ubar:
Fast extended test access via JTAG and FPGAs.
ITC 2009: 1-7 |
| 2008 |
| 9 |  | Raimund Ubar,
Sergei Devadze,
Jaan Raik,
Artur Jutman:
Parallel fault backtracing for calculation of fault coverage.
ASP-DAC 2008: 667-672 |
| 8 |  | Artur Jutman,
Anton Tsertov,
Raimund Ubar:
Calculation of LFSR Seed and Polynomial Pair for BIST Applications.
DDECS 2008: 275-278 |
| 7 |  | Tomas Bengtsson,
Shashi Kumar,
Raimund Ubar,
Artur Jutman,
Zebo Peng:
Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols.
IET Computers & Digital Techniques 2(6): 445-460 (2008) |
| 2007 |
| 6 |  | Raimund Ubar,
Sergei Devadze,
Jaan Raik,
Artur Jutman:
Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs.
European Test Symposium 2007: 131-136 |
| 5 |  | Raimund Ubar,
Artur Jutman,
Margus Kruus,
Elmet Orasson,
Sergei Devadze,
Heinz-Dietrich Wuttke:
Learning Digital Test and Diagnostics via Internet.
iJOE 3(1): (2007) |
| 2006 |
| 4 |  | Tomas Bengtsson,
Artur Jutman,
Shashi Kumar,
Raimund Ubar,
Zebo Peng:
Off-Line Testing of Delay Faults in NoC Interconnects.
DSD 2006: 677-680 |
| 2005 |
| 3 |  | Artur Jutman,
Jaan Raik,
Raimund Ubar,
V. Vislogubov:
An Educational Environment for Digital Testing: Hardware, Tools, and Web-Based Runtime Platform.
DSD 2005: 412-419 |
| 2 |  | Jaan Raik,
Raimund Ubar,
Sergei Devadze,
Artur Jutman:
Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs.
EDCC 2005: 332-344 |
| 2001 |
| 1 |  | Raimund Ubar,
Artur Jutman,
Zebo Peng:
Timing simulation of digital circuits with binary decision diagrams.
DATE 2001: 460-466 |