 | 2011 |
|---|
| 10 |       | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Functional fault models for non-scan sequential circuits.
Microelectronics Reliability 51(12): 2402-2411 (2011) |
| 2009 |
|---|
| 9 | | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Functional delay test generation based on software prototype.
Microelectronics Reliability 49(12): 1578-1585 (2009) |
| 2008 |
|---|
| 8 | | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Development of Functional Delay Tests.
DSD 2008: 626-632 |
| 7 | | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Test generation at the algorithm-level for gate-level fault coverage.
Microelectronics Reliability 48(7): 1093-1101 (2008) |
| 2007 |
|---|
| 6 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Transition Faults Testing Based on Functional Delay Tests.
DDECS 2007: 371-376 |
| 5 | | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
The Criteria of Functional Delay Test Quality Assessment.
DSD 2007: 207-214 |
| 4 | | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Functional Test Generation Based on Combined Random and Deterministic Search Methods.
Informatica, Lith. Acad. Sci. 18(1): 3-26 (2007) |
| 2006 |
|---|
| 3 | | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Transition Fault Test Reuse.
DSD 2006: 323-330 |
| 2005 |
|---|
| 2 | | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Functional Test Generation Remote Tool.
DSD 2005: 192-195 |
| 1 | | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
The Realization-Independent Testing Based on the Black Box Fault Models.
Informatica, Lith. Acad. Sci. 16(1): 19-36 (2005) |
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