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Sung-Woo Jung Coauthor index pubzone.org

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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSeung-Hyun Song, Jae-Chul Kim, Sung-Woo Jung, Yoon-Ha Jeong: Junction Depth Dependence of the Gate Induced Drain Leakage in Shallow Junction Source/Drain-Extension Nano-CMOS. IEICE Transactions 91-C(5): 761-766 (2008)

Coauthor Index

1Yoon-Ha Jeong [1]
2Jae-Chul Kim [1]
3Seung-Hyun Song [1]

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